Rapid Measurement and Control of Nitrogen-Vacancy Center-Axial Orientation in Diamond Particles*

Abstract

Determination and control of nitrogen-vacancy (NV) centers play an important role in sensing the vector field by using their quantum information. To measure orientation of NV centers in a diamond particle attached to a tapered fiber rapidly, we propose a new method to establish the direction cosine matrix between the lab frame and the NV body frame. In this method, only four groups of the ODMR spectrum peaks shift data need to be collected, and the magnetic field along ± Z and ± Y in the lab frame is applied in the meantime. We can also control any NV axis to rotate to the X, Y, Z axes in the lab frame according to the elements of this matrix. The demonstration of the DC and microwave magnetic field vector sensing is presented. Finally, the proposed method can help us to perform vector magnetic field sensing more conveniently and rapidly.

A novel demodulation method for transmission using nitrogen–vacancy-based solid-state quantum sensor

“…When the direction of the magnetic field is perpendicular to the NV axis, the number of peaks in the ODMR spectrum will reduce to four. [18,19] As the magnetic field strength increases, the peak position, that is, the resonance frequency, will linearly increase, as shown in Fig. 2(a).…”

“…At present, BAW filters on the market are mainly monopolized by Qorvo and Broadcom, and the bandwidth of existing band-pass filters is generally greater than 20 MHz, especially high-frequency band-pass filters, so the communication quality will be much lower than that of lowfrequency transmission with narrower pass band width. The NV center of diamond has a stable high-frequency resonance frequency, [15,16] and the resonance frequency can be linearly adjusted by an external magnetic field, [17][18][19] and attenuates fast at the non-resonant frequency. It has the excellent characteristics of low passband width and is able to be a good tool for demodulating the high-frequency signal.…”

Surface H‐field mapping of a microwave limiter chip based on quantum diamond probe

“…18 On the other hand, NV center in diamond serves as a quantum sensor that measures the absolute value of magnetic field strength. 19 It has the advantages of a broad frequency range, frequency tunability, and minimized invasiveness to the device under test 20,21 an ideal candidate for wafer/die level EMC test. 22 In this work, we propose a micron-resolved surface H-field imaging system based on diamond NV centers, 23 and use it to measure the electromagnetic field distribution on the surface of the limiter chip.…”

“…It can be extended to a single NV center level at the subnanometer, allowing high‐resolution microwave field imaging at the wafer or a single die level 18 . On the other hand, NV center in diamond serves as a quantum sensor that measures the absolute value of magnetic field strength 19 . It has the advantages of a broad frequency range, frequency tunability, and minimized invasiveness to the device under test 20,21 an ideal candidate for wafer/die level EMC test 22 .…”