Ray tracing application in hard x-ray optical development: Soleil first wiggler beamline (PSICHÉ) case

Abstract

Optical design of hard x-ray beamlines can be accurately performed through ray tracing simulation technique. We describe here the way and the tools we use at SOLEIL to develop hard x-ray beamlines such as PSICHÉ, which is a wiggler beamline performing diffraction and tomography experiments from 20 to 50 keV. This beamline is made of two focusing stages, one with a long vertical focusing mirror together with a sagittal focusing crystal monochromator to gain a spot of 100×50 μm and the other one applying a set of graded multilayer KB mirrors to reach 10×10 μm spot. Ray tracing simulations are performed with SpotX, which provides optical properties of the beamline taking into account thermal load on optics, surface polishing defects from the profilometer measurements.