1988
DOI: 10.1111/j.1151-2916.1988.tb05793.x
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Reactions of Silicon‐Based Ceramics in Mixed Oxidation Chlorination Environments

Abstract: The reaction of silicon‐based ceramics with 2% Cl2/Ar and 1% Cl2/1% to 20% O2/Ar at 950 °C was studied with thermogravimetric analysis and high‐pressure mass spectrometry. Pure Si, SiO2, several types of SiC, and Si3N4 were examined. The primary corrosion products were SiCl4(g) and SiO2(s) with smaller amounts of volatile silicon oxychlorides. The reactions appear to occur by chlorine penetration of the SiO2 layer, and gas‐phase diffusion of the silicon chlorides away from the sample appears to be rate limitin… Show more

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Cited by 38 publications
(10 citation statements)
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“…It was found that the substrate was attacked by hydrogen chloride at a rate that increased with temperature, but was by more than three orders of magnitude lower than the deposition rates seen in a HCl-free feed stream at the same temperature. [35] These results are in agreement with the findings of Marra et al, [37] who reported that 2 % HCl in Ar did not etch SiC at 1 atm and 950°C. The increase in the etching rate with the temperature agrees with the results of Allendorf and Outka, [38] in experiments carried out under high vacuum, which indicated that when SiC is exposed to HCl, chlorine bonds to Si atoms, leading to desorption of SiCl 4 around 1300 K. Several experimental studies, [37,39,40] covering a wide range of pressure, have reported that etching of silicon carbide by Cl 2 -containing gas mixtures can take place at rates dependent on the composition of the film (increasing as the silicon content of the material increases) and the composition of the corrosive mixture.…”
Section: Hydrogen Chloride Effects On Deposit Morphology and Stoichiosupporting
confidence: 95%
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“…It was found that the substrate was attacked by hydrogen chloride at a rate that increased with temperature, but was by more than three orders of magnitude lower than the deposition rates seen in a HCl-free feed stream at the same temperature. [35] These results are in agreement with the findings of Marra et al, [37] who reported that 2 % HCl in Ar did not etch SiC at 1 atm and 950°C. The increase in the etching rate with the temperature agrees with the results of Allendorf and Outka, [38] in experiments carried out under high vacuum, which indicated that when SiC is exposed to HCl, chlorine bonds to Si atoms, leading to desorption of SiCl 4 around 1300 K. Several experimental studies, [37,39,40] covering a wide range of pressure, have reported that etching of silicon carbide by Cl 2 -containing gas mixtures can take place at rates dependent on the composition of the film (increasing as the silicon content of the material increases) and the composition of the corrosive mixture.…”
Section: Hydrogen Chloride Effects On Deposit Morphology and Stoichiosupporting
confidence: 95%
“…[35] These results are in agreement with the findings of Marra et al, [37] who reported that 2 % HCl in Ar did not etch SiC at 1 atm and 950°C. The increase in the etching rate with the temperature agrees with the results of Allendorf and Outka, [38] in experiments carried out under high vacuum, which indicated that when SiC is exposed to HCl, chlorine bonds to Si atoms, leading to desorption of SiCl 4 around 1300 K. Several experimental studies, [37,39,40] covering a wide range of pressure, have reported that etching of silicon carbide by Cl 2 -containing gas mixtures can take place at rates dependent on the composition of the film (increasing as the silicon content of the material increases) and the composition of the corrosive mixture. The effects of HCl on the composition of the deposited film are in agreement with the well-documented etching of Si, [41,42] the resistance of SiC to chlorine containing mixtures, the preferential bonding of chlorine to silicon atoms, [43] and the occurrence of residual carbon in SiC samples exposed to chlorine.…”
Section: Hydrogen Chloride Effects On Deposit Morphology and Stoichiosupporting
confidence: 95%
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“…By mass spectrometric investigations in CI 2 /Ar and CI 2 /0 2 /Ar at 950°C the formation of the volatile compounds SiCl 4 , SiCI 3 , Si 2 0CI 6 , and Si 3 0CI g was observed [19]. Therefore, silicon carbide ceramics are not suitable for use in Cl 2 -containing atmospheres at high temperatures.…”
Section: I4influence Of Chlorinementioning
confidence: 95%
“…Corrosion in halogenides and SO 2 /SO 3 is not treated (see Jacobson, 1993;Marra, Kreidler, Jacobson, & Fox, 1988;Nickel & Gogotsi, 2000;Nickel et al, 2010;Presser, Heon, & Gogotsi, 2011;Readey, 1998;Van der Biest, Barnes, Corish, & Norton, 1987). Presser and co-workers (Presser et al, 2011) provide an overview of the reaction of different carbides with Cl 2 .…”
Section: Corrosion In Gasesmentioning
confidence: 98%