2019 IEEE Applied Power Electronics Conference and Exposition (APEC) 2019
DOI: 10.1109/apec.2019.8721825
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Real-Time, In Situ Degradation Monitoring in Power Semiconductor Converters

Timothy A. Polom
1
,
Christoph van der Broeck
2
,
Rik W. De Doncker
3
et al.
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Cited by 18 publications
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References 25 publications
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Utilizing Electroluminescence of SiC MOSFETs for Unified Junction-Temperature and Current Sensing

Kalker
1
,
Broeck
2
,
Doncker
3
2020
2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
20
0
12
0
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Utilizing Electroluminescence of SiC MOSFETs for Unified Junction-Temperature and Current Sensing

Kalker
1
,
Broeck
2
,
Doncker
3
2020
2020 IEEE Applied Power Electronics Conference and Exposition (APEC)
20
0
12
0
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Thermal Monitoring of Power Electronic Modules with Minimal Sensing Effort

Broeck
1
,
Doncker
2
2019
2019 IEEE Energy Conversion Congress and Exposition (ECCE)
14
0
2
0
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Active Thermal Management for Enhancing Peak-Current Capability of Three-Phase Inverters

Broeck
1
,
Doncker
2
2020
2020 IEEE Energy Conversion Congress and Exposition (ECCE)
12
0
2
0
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