2019
DOI: 10.1380/ejssnt.2019.155
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Real-time Observation of Interface Atomic Structures by an Energy-Dispersive Surface X-ray Diffraction

Abstract: Surface X-ray diffraction is a powerful tool for studying the atomic structure of buried interfaces nondestructively. The analysis is often limited to the static structures, since the acquisition of crystal truncation rod (CTR) profile dataset is lengthy. Recently, high-speed methods have been developed by several groups, aiming for the in operando study of interface phenomena. Our method uses energy-dispersive convergent X-rays and area detector, and allows the quantitative structure analysis during irreversi… Show more

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Cited by 3 publications
(1 citation statement)
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“…For example, the diffraction rods perpendicular to the catalytic surface using high energy X‐ray can reach sub‐Ǻ resolution, which is able to provide precise information on the atomic interface geometry with non‐destructive sample process, which can present a big advantage over other known characterizations, such as electron diffractions and microscopies. [ 71 ] Moreover, several groups have developed high‐speed SXRD methods to solve the conventional disadvantages of long time‐response and poor quantification. For example, Shirasawa et al.…”
Section: Fundamentals Of Interfacesmentioning
confidence: 99%
“…For example, the diffraction rods perpendicular to the catalytic surface using high energy X‐ray can reach sub‐Ǻ resolution, which is able to provide precise information on the atomic interface geometry with non‐destructive sample process, which can present a big advantage over other known characterizations, such as electron diffractions and microscopies. [ 71 ] Moreover, several groups have developed high‐speed SXRD methods to solve the conventional disadvantages of long time‐response and poor quantification. For example, Shirasawa et al.…”
Section: Fundamentals Of Interfacesmentioning
confidence: 99%