2017
DOI: 10.1016/j.sab.2017.09.008
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Real-time qualitative study of forsterite crystal – Melt lithium distribution by laser-induced breakdown spectroscopy

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Cited by 18 publications
(7 citation statements)
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“…There is the additional feature that LIBS sampling is highly spatially resolved, as the plasma forms over a limited spatial area of only tens to hundreds of microns on the sample surface, so that only a small amount of material (typically picograms to nanograms) is sampled by each laser pulse. This allows for in situ analysis of individual particles, mineral grains, or inclusions [33,[37][38][39][40][41], as well as the fine-scale compositional mapping of a complex sample such as a chemically zoned mineral [42][43][44][45][46][47], the analysis of thin crusts, coatings, or surface alteration zones without substrate interference [48], or chemical analysis at highly spatially resolved spatial scales to below~10 µm [47,[49][50][51][52][53][54]. Stratigraphic analysis of a sample by depth profiling is also possible, as sequential ablation forms a vertical crater that progressively bores down into a sample with successive laser pulses [55][56][57].…”
Section: Specific Attributes Of Libsmentioning
confidence: 99%
“…There is the additional feature that LIBS sampling is highly spatially resolved, as the plasma forms over a limited spatial area of only tens to hundreds of microns on the sample surface, so that only a small amount of material (typically picograms to nanograms) is sampled by each laser pulse. This allows for in situ analysis of individual particles, mineral grains, or inclusions [33,[37][38][39][40][41], as well as the fine-scale compositional mapping of a complex sample such as a chemically zoned mineral [42][43][44][45][46][47], the analysis of thin crusts, coatings, or surface alteration zones without substrate interference [48], or chemical analysis at highly spatially resolved spatial scales to below~10 µm [47,[49][50][51][52][53][54]. Stratigraphic analysis of a sample by depth profiling is also possible, as sequential ablation forms a vertical crater that progressively bores down into a sample with successive laser pulses [55][56][57].…”
Section: Specific Attributes Of Libsmentioning
confidence: 99%
“…Излучение передавалось по оптоволокну диаметром 600 µm на входную апертуру спектрометра AvaSpec-ULS2048L-USB2 (Avantes) со спектральным разрешением 1 nm. Запуск лазера, синхронизация его работы со спектрометром, регистрация и обработка спектров плазмы осуществлялись с помощью собственного программного обеспечения [6].…”
unclassified
“…Важно отметить, что эффективность работы ЛИЭС-системы в этом случае также обеспечивалась соответствующим алгоритмом обработки спектров излучения плазмы, устойчивым к изменению интенсивности излучения плазмы от импульса к импульсу [6]. Важной математической процедурой современных алгоритмов обработки спектров излучения плазмы является их нормализация, т. е. вычисление относительного вклада полосы излучения исследуемого химического элемента в полный спектр излучения плазмы.…”
unclassified
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