2021
DOI: 10.1109/tmtt.2021.3060756
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Real-Time Removal of Topographic Artifacts in Scanning Microwave Microscopy

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Cited by 11 publications
(7 citation statements)
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“…Another calibration issue occurs as the AFM or STM tip scans across the sample and carries with it RF signal changes that are associated with the topological properties of the sample itself, which must be separated from sample electrical properties. 8 Solutions include scanning the sample stage without the sample present and subtracting point by point, or most recently, using a novel analytic method coupled to the probe geometry [42].…”
Section: A Smm-vnamentioning
confidence: 99%
See 1 more Smart Citation
“…Another calibration issue occurs as the AFM or STM tip scans across the sample and carries with it RF signal changes that are associated with the topological properties of the sample itself, which must be separated from sample electrical properties. 8 Solutions include scanning the sample stage without the sample present and subtracting point by point, or most recently, using a novel analytic method coupled to the probe geometry [42].…”
Section: A Smm-vnamentioning
confidence: 99%
“…The author thanks one of the reviewers for bringing out this point and for the associated recent reference[42].…”
mentioning
confidence: 96%
“…A rotating axisymmetric model [26,27] by finite element analysis was established in COMSOL Multiphysics (5.5A), shown in figure 3(a). A frustum shape of the copper probe together with the tested samples corresponded to the experimental configuration of NSMM system in the experiment.…”
Section: Simulationmentioning
confidence: 99%
“…Over the past decade, one of the most significant advances in the field of microwave testing has been the emergence of scanning microwave microscopy [1][2][3][4][5][6][7][8][9]. There are two main types of scanning microwave microscope, categorized according to the source of the microwave signals at the scanning tip, with one type using a microwave resonator coupled to the tip of the probe using a small aperture and the other using a coaxial transmission line directly attached the tip of the atomic force microscopy (AFM) cantilever.…”
Section: Introductionmentioning
confidence: 99%