This is the unedited version of the paper accepted and published by Applied Physics Letters in March 8 th 2019, DOI: doi.org/10.1063/1.5086259, link to the complete work: https://aip.scitation.org/doi/abs/10.1063/1.5086259 At the same link, freely available the Supplementary Information. The manuscript is posted for self-archiving purposes according to embargo rules by Applied Physics Letters." This paper presents for the first time an innovative instrument called an inverted scanning microwave microscope (iSMM), which is capable of noninvasive and label-free imaging and characterization of intracellular structures of a live cell on the nanometer scale. In particular, the iSMM is sensitive to not only surface structures, but also electromagnetic properties up to one micrometer below the surface. Conveniently, the iSMM can be constructed through straightforward conversion of any scanning probe microscope, such as the atomic force microscope or the scanning tunneling microscope, with a simple metal probe to outperform traditional SMM in terms of ruggedness, bandwidth, sensitivity and dynamic range. By contrast,

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