PurposeThe purpose of this paper is to present the dependence of capacitive sensing of organic vapours by porous silicon (PS) on its molecular structure for the realization of a organic vapour sensor, compatible with existing silicon technology, with desired miniaturization and selectivity.Design/methodology/approachThe method introduces large surface area of PS obtained by electrochemically etching of silicon wafer for characterization of organic vapours through capacitive sensing.FindingsThe method provides a comparative study of sensor response for organic vapour molecules of different structures and leads to an insight into the sensing mechanism.Research limitations/implicationsThe surface of PS has been stabilized by thermal oxidation process.Practical implicationsThe method is useful for the development of a simple, cost‐effective sensor for selective gas analysis.Originality/valueThe result is an outcome of regular experimental work carried out to observe the capacitive sensing behavior of PS for different organic vapours.