2018
DOI: 10.1038/s41467-018-06053-z
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Realization of vertical metal semiconductor heterostructures via solution phase epitaxy

Abstract: The creation of crystal phase heterostructures of transition metal chalcogenides, e.g., the 1T/2H heterostructures, has led to the formation of metal/semiconductor junctions with low potential barriers. Very differently, post-transition metal chalcogenides are semiconductors regardless of their phases. Herein, we report, based on experimental and simulation results, that alloying between 1T-SnS2 and 1T-WS2 induces a charge redistribution in Sn and W to realize metallic Sn0.5W0.5S2 nanosheets. These nanosheets … Show more

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Cited by 57 publications
(55 citation statements)
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“…The lattice fringe distance measured is ≈0.321 nm, which is consistent with the (100) spacing plane of SnS 2 . Interestingly, the atomically resolved STEM measurement of Sn 0.3 W 0.7 S 2 nanosheets reveals that these flakes are in the 1T′ phase structure, as shown in Figure b, with clear zigzag chains showing the shortest W‐W distance of 2.80 Å, which is in good agreement with previous reports . The Sn ( N = 50, green circle) and W ( N = 74, blue circle) atoms can be distinguished according to the ADF contrast, where heavier atoms appear brighter.…”
Section: Resultssupporting
confidence: 90%
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“…The lattice fringe distance measured is ≈0.321 nm, which is consistent with the (100) spacing plane of SnS 2 . Interestingly, the atomically resolved STEM measurement of Sn 0.3 W 0.7 S 2 nanosheets reveals that these flakes are in the 1T′ phase structure, as shown in Figure b, with clear zigzag chains showing the shortest W‐W distance of 2.80 Å, which is in good agreement with previous reports . The Sn ( N = 50, green circle) and W ( N = 74, blue circle) atoms can be distinguished according to the ADF contrast, where heavier atoms appear brighter.…”
Section: Resultssupporting
confidence: 90%
“…In addition, the peak intensity at 9.2° becomes much stronger in the case of x = 0.7 due to the more stable structure between W and Sn in the T′ phase. The characteristic peaks at 9.2° and 15.6° are consistent with reported results corresponding to the (002) and (004) planes, respectively . The sharp peak of Sn 0.35 W 0.65 S 2 at ≈15.6° is diminished for Sn 0.3 W 0.7 S 2 , which may be due to the formation of the T′ phase structure and, consequently, the formation of more defects.…”
Section: Resultssupporting
confidence: 90%
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“…Recently, a novel solution‐based approach has been exploited for synthesizing high‐quality 2D TMD films, which is a simple and inexpensive method to control the number of layers and implement diverse structures . Moreover, it can yield high‐quality heterojunctions, indicating the possibility of fabricating functional devices via a scalable process …”
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confidence: 99%