2008
DOI: 10.1088/0953-8984/20/9/093002
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Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM

Abstract: Synchrotron-based photoemission electron microscopy (XPEEM) is one of the most powerful spectro-microscopic techniques for the investigation of surfaces, interfaces, thin films and buried layers. By exploiting the tunability and polarizability of x-ray sources as well as progress in electron optics design, modern XPEEM instruments can perform several x-ray spectroscopic investigations with a lateral resolution of a few tens of nanometres. We review here the latest developments in XPEEM, illustrating the state … Show more

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Cited by 143 publications
(114 citation statements)
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“…The capability to perform laterallyresolved electron backscattering (Low-Energy Electron ISSN 1348-0391 c ⃝ 2015 The Surface Science Society of Japan (http://www.sssj.org/ejssnt)Microscopy, LEEM) [8,9] and x-ray photoemission (Xray PhotoEmission Electron Microscopy, XPEEM) [10] measurements provides a complete structural and chemical map of a given surface area with high spatial resolution of about 10 nm in LEEM and 30 nm in XPEEM. In addition, by imaging the back-focal plane, Low-Energy Electron Diffraction (LEED) data can be collected from micron-sized regions.…”
Section: Methodsmentioning
confidence: 99%
“…The capability to perform laterallyresolved electron backscattering (Low-Energy Electron ISSN 1348-0391 c ⃝ 2015 The Surface Science Society of Japan (http://www.sssj.org/ejssnt)Microscopy, LEEM) [8,9] and x-ray photoemission (Xray PhotoEmission Electron Microscopy, XPEEM) [10] measurements provides a complete structural and chemical map of a given surface area with high spatial resolution of about 10 nm in LEEM and 30 nm in XPEEM. In addition, by imaging the back-focal plane, Low-Energy Electron Diffraction (LEED) data can be collected from micron-sized regions.…”
Section: Methodsmentioning
confidence: 99%
“…Finally, another important aspect of the application of LEEM and PEEM is the possibility of performing ultra-fast measurements to follow structural processes or reactions at much shorter time scale (sub nanosecond regime), with the potential capability of identifying reactions intermediates and allowing correlations with the surface structure [73]. The approach of time-resolved measurements with high time resolution in the picosecond range with PEEM has been already reported for the study of magnetic properties of certain materials [74,75] and, more recently, for the study of plasmon propagation on metallic surfaces [76].…”
Section: Future Perspectivesmentioning
confidence: 99%
“…In this subsection we do not want to fully discuss PEEM spectro-microscopy, we will focus only on that part of the PEEM applications which deal with magnetic microscopy, based on the XMCD and XLMD effects, which are the main subject of this article. More information one can nd in the literature [16,51]. This microscopy mode is based on absorption spectroscopy with spatial resolution, in which we detect the secondary electrons as a function of photon energy.…”
Section: Dilute Magnetic Semiconductorsmentioning
confidence: 99%