2021
DOI: 10.3390/mi12080991
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Recent Advances in Reactive Ion Etching and Applications of High-Aspect-Ratio Microfabrication

Abstract: This paper reviews the recent advances in reaction-ion etching (RIE) for application in high-aspect-ratio microfabrication. High-aspect-ratio etching of materials used in micro- and nanofabrication has become a very important enabling technology particularly for bulk micromachining applications, but increasingly also for mainstream integrated circuit technology such as three-dimensional multi-functional systems integration. The characteristics of traditional RIE allow for high levels of anisotropy compared to … Show more

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Cited by 141 publications
(76 citation statements)
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“…RIE process itself is also very useful for high-aspect-ratio profiles. Recent advances in reactive ion etching for application in high-aspect-ratio microfabrication have been presented by Huff [ 26 ].…”
Section: The Icp-rie Methodsmentioning
confidence: 99%
“…RIE process itself is also very useful for high-aspect-ratio profiles. Recent advances in reactive ion etching for application in high-aspect-ratio microfabrication have been presented by Huff [ 26 ].…”
Section: The Icp-rie Methodsmentioning
confidence: 99%
“…This is because the principle of dry etching involves using the plasma of chemical gas to produce a chemical reaction, and accelerate physical etching and chemical etching through an electric field, so the etching is isotropic. It should be mentioned that by changing the etching gas in the cycle during the etching process, high-aspect-ratio silicon microstructures can be realized [39,40]. Therefore, different patterned silicon-based microlens arrays can be prepared using this method.…”
Section: Preparation Of Microlensmentioning
confidence: 99%
“…In low-pressure plasmas, the directionality of ion bombardment causes a preferred removal at vertical incidence (bottom), whereas a sidewall polymer layer inhibits the lateral etching of the material. 40 Thus, surfaces oriented perpendicular to the ion incidence usually show a higher etch rate than the sidewalls of the structures. 41 The overall etching is defined by the amount of chemically active species in the plasma, their diffusion onto the substrate surface and the flux, the angular distribution, and the kinetic energy of the positive ions accelerated to the substrate surface.…”
Section: Reactive Ion Etching Processmentioning
confidence: 99%