2021
DOI: 10.1155/2021/4426254
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Recent Advances on SEM-Based In Situ Multiphysical Characterization of Nanomaterials

Abstract: Functional nanomaterials possess exceptional mechanical, electrical, and optical properties which have significantly benefited their diverse applications to a variety of scientific and engineering problems. In order to fully understand their characteristics and further guide their synthesis and device application, the multiphysical properties of these nanomaterials need to be characterized accurately and efficiently. Among various experimental tools for nanomaterial characterization, scanning electron microsco… Show more

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Cited by 8 publications
(5 citation statements)
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“…The physical properties of honey-mediated Fe 2 O 3 -NPs were analyzed by scanning electron microscopy (SEM). Real-time pictures of the samples, clarity at the nanometer level of 20 to 100 nm, and a broad traversing zone of nanoparticles are all provided by this methodology [ 61 ]. The SEM instrument JSM-6380 with a potential energy of 15 KV and magnification up to 20,000x was used to examine morphological properties (size and shape) of the synthesized Fe 2 O 3 -NPs.…”
Section: Methodsmentioning
confidence: 99%
“…The physical properties of honey-mediated Fe 2 O 3 -NPs were analyzed by scanning electron microscopy (SEM). Real-time pictures of the samples, clarity at the nanometer level of 20 to 100 nm, and a broad traversing zone of nanoparticles are all provided by this methodology [ 61 ]. The SEM instrument JSM-6380 with a potential energy of 15 KV and magnification up to 20,000x was used to examine morphological properties (size and shape) of the synthesized Fe 2 O 3 -NPs.…”
Section: Methodsmentioning
confidence: 99%
“…83,99 In principle, similar in situ sample holders as developed for TEM can be used in SEM. 100 In addition, SEM can also be coupled with a focused ion beam (FIB) cutting/sec-tioning to investigate the internal mesoscopic 3D structures of different compounds. 100,101 A FIB-SEM measurement can be classified in FIB-SEM processing, imaging analysis, and quan- titative 3D reconstruction.…”
Section: In Situ Saxsmentioning
confidence: 99%
“…100 In addition, SEM can also be coupled with a focused ion beam (FIB) cutting/sec-tioning to investigate the internal mesoscopic 3D structures of different compounds. 100,101 A FIB-SEM measurement can be classified in FIB-SEM processing, imaging analysis, and quan- titative 3D reconstruction. The specimen is sectioned/milled with FIB so that SEM images from the exposed cross-section can be recorded.…”
Section: In Situ Saxsmentioning
confidence: 99%
“…Single-cell stiffness is determined based on this deformation information. Finally, the results show that the stiffness of a cell decreases with increasing humidity [ 19 ]. Korayem et al Used an atomic force microscope to study the force applied to deform a DNA cell during the manipulation process.…”
Section: Introductionmentioning
confidence: 99%