Recent Developments of Multilayer Mirror Optics for Laboratory X-ray Instrumentation

Michaelsen, C.; Wiesmann, J.; Hoffmann, Christian; Wulf, K.; Brügemann, L.; Storm, A.J.

doi:10.1117/12.469363

Cited by 11 publications

(8 citation statements)

References 10 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The primary and specularly reflected beams are suppressed by the beamstops. The latest advances in the low-power X-ray generators and the efficient X-ray optics opened a new era of laboratory equipments suitable for GISAXS measurements (Michaelsen, Wiesmann et al 2002). Nowadays already several companies (Bruker AXS, Anton Paar, Hecus XRS, Rigaku) supply complete X-ray solutions supporting GISAXS measurement modes for solid-state samples.…”

Section: Iq F( Q ) F ( Q ) E X Pi Q ( R R)mentioning

confidence: 99%

Self-Assembly of Nanoparticles at Solid and Liquid Surfaces

Šiffalovič¹,

Majková²,

Jergel³

et al. 2012

Smart Nanoparticles Technology

View full text Add to dashboard Cite

Section: Iq F( Q ) F ( Q ) E X Pi Q ( R R)mentioning

confidence: 99%

Self-Assembly of Nanoparticles at Solid and Liquid Surfaces

Šiffalovič¹,

Majková²,

Jergel³

et al. 2012

Smart Nanoparticles Technology

View full text Add to dashboard Cite

“…XRR may elucidate the inner architecture of periodic multilayers that are also termed superlattices (as a special case of multilayers). The layer system presented in the example has been investigated with respect to its ref lectivity for characteristic K radiation from carbon at 277 eV for the purposes of elemental analysis [13]. The XRR curve of such multilayers is characterized by various features that are illustrated for the example of an x-ray mirror system shown in Fig.…”

Section: Ref Lectivity Of Multilayers and Superlatticesmentioning

confidence: 99%

“…13 Schematic representation of reflected and refracted beams for the derivation of their phase difference ∆.…”

mentioning

confidence: 99%

Grazing Incidence Configurations

Birkholz

2005

Thin Film Analysis by X‐Ray Scattering

View full text Add to dashboard Cite

The x-ray attenuation coefficient µ has been introduced in previous chapters and shown to have a value of about 10 4 -10 5 m -1 . The penetration depths of x-rays, i.e. the corresponding 1/µ values, are accordingly found in the 10-100 µm range. In most thin-film investigations the thickness is substantially less causing a large fraction of the diffractogram as measured in the symmetric θ/2θ configuration to stem from the substrate. In the case of thin films with thicknesses in the nanometer range or less only negligible structural information can be gained in this measuring configuration. The path traveled by the x-ray in the sample, which is of the order of sinθ/µ, is too short for typical Bragg angles to deliver x-ray ref lections of sufficient peak-to-noise ratio.Especially for the analysis of thin films, x-ray diffraction techniques have been developed for which the primary beam enters the sample at very small angles of incidence. In its simplest variant this configuration is called GIXRD: grazing incidence x-ray diffraction. The small entrance angle causes the path traveled by the xrays to increase significantly and the structural information contained in the diffractogram to stem primarily from the thin film. The parafocusing geometry as applied in conventional powder diffractometry cannot be used in these experiments and new beam-shaping devices for parallel x-ray optics have had to be developed. These and further details of the measurement geometry are described in Section 4.1 and in Instrumental Box 5. Moreover, the GIXRD technique allows one to obtain depth-resolved structural information by measuring diffractograms under different angles of incidence. This is evaluated in Section 4.2. Up to this point the chapter will be concerned with diffraction phenomena only. In addition to the information given in the previous chapters the peculiarities are developed that arise only under very small angles of incidence.Presentation is made of an x-ray technique that is named x-ray ref lectometry or x-ray ref lectivity (XRR), and which does not rely on the diffraction of x-rays. Rather it makes use of ref lection and refraction of radiation and similarly as in optical ellipsometry the real and imaginary parts of the complex index of refraction of a thin film can be determined. The decisive distinction between both methods is the wavelength of the radiation, which differs by about three orders of magnitude. For this reason the associated phenomena may be observed only under very small incidence angles in the case when x-rays are applied. A further characteristic of XRR Grazing Incidence Conf igurationsThin Film Analysis by X-Ray Scattering. M. Birkholz

show abstract

“…Especially focusing multilayer optics offer the large intensity that is required for complete structure analyses in homelaboratories. These type of optics are now used for more than a decade and have proven their usefulness [1][2][3] . The technology required for the fabrication is readily available and these optics are quickly replacing the graphite monochromator that is traditionally used in home-laboratory SCD systems.…”

Section: Introductionmentioning

confidence: 99%

Multilayer optics for Mo-radiation-based crystallography

Storm¹,

Michaelsen²,

Oehr³

et al. 2004

SPIE Proceedings

Self Cite

View full text Add to dashboard Cite

We present an optic for laboratory Mo-Kα single crystal diffraction systems. The optic is comprised of two elliptically bent focusing multilayers, which are arranged in the Montel scheme. The paper shows the design and performance of the optic. A comparison with a graphite monochromator shows a five-fold intensity enhancement. Especially small and weakly diffracting crystals benefit from the large intensity produced by the optic, as illustrated by diffraction analyses.

show abstract

Recent Developments of Multilayer Mirror Optics for Laboratory X-ray Instrumentation

Cited by 11 publications

References 10 publications

Self-Assembly of Nanoparticles at Solid and Liquid Surfaces

Self-Assembly of Nanoparticles at Solid and Liquid Surfaces

Grazing Incidence Configurations

Multilayer optics for Mo-radiation-based crystallography

Contact Info

Product

Resources

About