2007
DOI: 10.1109/jqe.2007.902301
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Recent Progress on 1.55-$\mu{\hbox {m}}$ Dilute-Nitride Lasers

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Cited by 91 publications
(64 citation statements)
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“…[1][2][3] In particular, the presence of a small amount of nitrogen in the In x Ga 1−x As alloy causes a dramatic redshift of the host material band gap and an increased insensitivity of the band gap energy to temperature T. 4 However, fabrication of high-quality Ga 1−x In x N y As 1−ybased 1.55-μm devices remains a difficult task due to a large miscibility gap, which in turn results in an increased tendency for phase separation and strong carrier localization. 5,6 In the present work we use magneto-photoluminescence (magneto-PL) to study carrier localization in two contrasting samples: one grown at an elevated temperature and without lattice matching between the QWs and the barrier material, and one with optimized growth temperature and sample morphology. We build up a consistent phenomenological picture of the localization of electrons and holes in these two samples.…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3] In particular, the presence of a small amount of nitrogen in the In x Ga 1−x As alloy causes a dramatic redshift of the host material band gap and an increased insensitivity of the band gap energy to temperature T. 4 However, fabrication of high-quality Ga 1−x In x N y As 1−ybased 1.55-μm devices remains a difficult task due to a large miscibility gap, which in turn results in an increased tendency for phase separation and strong carrier localization. 5,6 In the present work we use magneto-photoluminescence (magneto-PL) to study carrier localization in two contrasting samples: one grown at an elevated temperature and without lattice matching between the QWs and the barrier material, and one with optimized growth temperature and sample morphology. We build up a consistent phenomenological picture of the localization of electrons and holes in these two samples.…”
Section: Introductionmentioning
confidence: 99%
“…The GaInNAsSb wafer was grown by molecular beam epitaxy (MBE) and comprised a single 7nm GaInNAsSb (41% In, 3.3%N, 3% Sb) well with 20nm GaNAs barriers either side; the waveguide core is 440 nm thick and Al 0.33 Ga 0.67 As provides the waveguide cladding [3]. After growth the structure was annealed at 680°C for 10 mins in a rapid thermal annealer using a GaAs proximity cap.…”
Section: Methodsmentioning
confidence: 99%
“…The addition of Sb has enabled the emission wavelength of this system to be extended to the 1.5 μm region [2], [3]. Further refinements have included the use of GaNAs barriers to compensate the large amount of strain in the wells [4].…”
Section: Introductionmentioning
confidence: 99%
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“…Although they succeeded in making excellent edge-emitting LDs, they could not make VCSELs because GaInNAs should be grown over an AlAs/GaAs DBR. Bank et al used an MBE system with dual growth chambers [37]. One chamber was used for growing GaInNAs, and the other was for growing AlGaAs.…”
Section: Solutionmentioning
confidence: 99%