This study investigates the effects of electron beam irradiation on the lasing characteristics of optically pumped CdSe quantum dot (QD) lasers grown on GaAs substrates using molecular beam epitaxy. The experimental setup allows the creation of two types of CdSe QDs with distinct size differences, with and without electron beam irradiation during the epitaxy. Lasing wavelengths were observed at 534 nm in the non-irradiated region and between 548 and 557 nm in the irradiated regions, depending on the electron beam irradiation conditions, achieving multi-wavelength lasing in the green-yellow ranges on a single chip. Internal laser parameters were evaluated for both irradiated and non-irradiated regions across different cavity lengths. Photoluminescence (PL) spectra revealed significantly higher integrated PL intensity in the irradiated regions compared to the non-irradiated regions, attributed to reduced point defects. However, at the lasing threshold, the impact of these defects is negligible. Lasing spectra exhibited a notable blue shift in the irradiated regions with an increase in threshold intensity due to the state-filling effect, which also causes a decrease in internal quantum efficiency. The modal gain and transparent intensity were evaluated, showing lower gain values in the irradiated regions, consistent with the observed broadening of the PL spectrum. These findings highlight the dynamic nature of the state-filling effect and its impact on lasing performance, providing insights into the mechanisms affecting CdSe QD lasers under electron beam irradiation in green-yellow spectrum range.