Reduction of Influence of the High-Frequency Noise on the Results of Surface Topography Measurements

Abstract

The influence of errors in the processes of detection and then reduction of surface topography measurement noise is of great importance; many research papers are concerned with the definition of this type of measurement error. This paper presents the influence of high-frequency measurement noise, defined for various types of surface textures, e.g., two-process plateau-honed, turned, ground, or isotropic. Procedures for the processing of raw measured data as a detection of the high-frequency errors from the results of surface topography measurements were proposed and verified (compared) according to the commonly used (available in the commercial software of the measuring equipment) algorithms. It was assumed that commonly used noise-separation algorithms did not always provide consistent results for two process textures with the valley-extraction analysis; as a result, some free-of-dimple (part of the analyzed detail where dimples do not exist) areas were not carefully considered. Moreover, the influence of measured data processing errors on surface topography parameter calculation was not comprehensively studied with high-frequency measurement noise assessments. It was assumed that the application of the Wavelet Noise Extraction Procedure (WNEP) might be exceedingly valuable when the reduction of a disparate range of measured frequencies (measurement noise) was carefully considered.

The Effect of Surface Topography Feature Size Density and Distribution on the Results of a Data Processing and Parameters Calculation with a Comparison of Regular Methods

“…Appertaining to the results obtained in previous studies and based on the modeled data, it was found that the presence of the high-frequency noise affects the values of selected surface topography parameters, defined as ‘noise-sensitive parameters’ (NSP) [ 18 ], to a much greater extent than other parameters. The following parameters have been highlighted as an NSP: Sz , Sdq , Sdr , Spd , Spc, and Sk .…”

“…Usually, differences for special parameters ( Sal , Str , Std ) were under 5% or were negligible, and when hybrid parameters were considered, the differences for root mean square gradient ( Sdq ) were slight. Nonetheless, all of those four parameters were defined previously as robust for the presence of the (high-frequency) noise [ 18 ]. Parameters related to the characterization of the peaks ( Spd , Spc ) underwent the greatest changes.…”

“…In general, received from the ST measurement process, a signal is composed of the background signal characterized by low frequency, a noise signal of high-frequency, and finally by the useful signal [ 18 ]. Those signals need to be processed separately.…”

In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes

“…There is extensive ongoing research to reduce the impact of noise and environmental disturbances on optical instruments. Examples of this for CSI can be found in [ 6 , 7 ]. Even if the reliability issues with optical instruments were to be solved, they would probably remain expensive even in the future.…”

Fast and Precise Non-Contact Measurement of Cylindrical Surfaces with Air Gauges

“…The various frequency characteristic components result in different impacts on the operation of the ultra-precise shafts due to the manufacturing errors on the components' surfaces [6]. As well as measurement and analysis of the surface topography of an engine cylinder-as a fingerprint of the manufacturing process [7]-it is also necessary to assess its meso-and macro-features: roundness and cylindricity.…”