Reduction of surface roughness of a silicon chip for advanced nanocalorimetry

Spina, L. La; Ovchinnikov, D. V.; Wien, W.; Herwaarden, A.W. van; Goudena, E.J.G.; Loos, Joachim; Nanver, L.K.

doi:10.1016/j.sna.2008.02.010

Cited by 5 publications

(2 citation statements)

References 21 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The sample holder of the AFM on top of the scanner tube was replaced by a socket for the TO5 housing of the FSC chip. Chips from Xensor Integration, Delfgauw, The Netherlands, [43,44] mounted on a TO5 housing allowed for direct access of the sample by the AFM tip (Figure 1 and Figure 2).…”

Section: Methodsmentioning

confidence: 99%

Visualization of Polymer Crystallization by In Situ Combination of Atomic Force Microscopy and Fast Scanning Calorimetry

et al. 2019

View full text Add to dashboard Cite

A chip-based fast scanning calorimeter (FSC) is used as a fast hot-stage in an atomic force microscope (AFM). This way, the morphology of materials with a resolution from micrometers to nanometers after fast thermal treatments becomes accessible. An FSC can treat the sample isothermally or at heating and cooling rates up to 1 MK/s. The short response time of the FSC in the order of milliseconds enables rapid changes from scanning to isothermal modes and vice versa. Additionally, FSC provides crystallization/melting curves of the sample just imaged by AFM. We describe a combined AFM-FSC device, where the AFM sample holder is replaced by the FSC chip-sensor. The sample can be repeatedly annealed at pre-defined temperatures and times and the AFM images can be taken from exactly the same spot of the sample. The AFM-FSC combination is used for the investigation of crystallization of polyamide 66 (PA 66), poly(ether ether ketone) (PEEK), poly(butylene terephthalate) (PBT) and poly(ε-caprolactone) (PCL).

show abstract

Section: Methodsmentioning

confidence: 99%

Visualization of Polymer Crystallization by In Situ Combination of Atomic Force Microscopy and Fast Scanning Calorimetry

et al. 2019

View full text Add to dashboard Cite

show abstract

“…These measurements are conducted in calorimetric microchips, in which the sample is placed on an amorphous silicon nitride membrane with a surface roughness of about 200 nm [66]. This roughness, if necessary, can be reduced by chemical etching to about 1-10 nm [67,68]. The roughness of the sample may be greater than that of the membrane at the beginning of sample melting.…”

Section: Evolution Of Thermal Contact Conductance G During the Pre-me...mentioning

confidence: 99%

Mesoscopic Effects of Interfacial Thermal Conductance during Fast Pre-Melting and Melting of Metal Microparticles

Минаков

Schick

2023

Applied Sciences

View full text Add to dashboard Cite

Interfacial thermal conductance (ITC) affects heat transfer in many physical phenomena and is an important parameter for various technologies. The article considers the influence of various mesoscopic effects on the ITC, such as the heat transfer through the gas gap, near-field radiative heat transfer, and changes in the wetting behavior during melting. Various contributions to the ITC of the liquid-solid interfaces in the processes of fast pre-melting and melting of metal microparticles are studied. The effective distance between materials in contact is a key parameter for determining ITC. This distance changes significantly during phase transformations of materials. An unusual gradual change in ITC recently observed during pre-melting below the melting point of some metals is discussed. The pre-melting process does not occur on the surface but is a volumetric change in the microstructure of the materials. This change in the microstructure during the pre-melting determines the magnitude of the dispersion forces, the effective distance, and the near-field thermal conductance. The knowledge gained can be useful for understanding and optimizing various technological processes, such as laser additive manufacturing.

show abstract

Integration of Fast Scanning Calorimetry (FSC) with Microstructural Analysis Techniques

Jiang

Lai

Zhou

2016

Fast Scanning Calorimetry

View full text Add to dashboard Cite

Reduction of surface roughness of a silicon chip for advanced nanocalorimetry

Cited by 5 publications

References 21 publications

Visualization of Polymer Crystallization by In Situ Combination of Atomic Force Microscopy and Fast Scanning Calorimetry

Visualization of Polymer Crystallization by In Situ Combination of Atomic Force Microscopy and Fast Scanning Calorimetry

Mesoscopic Effects of Interfacial Thermal Conductance during Fast Pre-Melting and Melting of Metal Microparticles

Integration of Fast Scanning Calorimetry (FSC) with Microstructural Analysis Techniques

Contact Info

Product

Resources

About