2020
DOI: 10.1109/access.2020.3029355
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Reference-Free Material Characterisation of Objects Based on Terahertz Ellipsometry

Abstract: Material characterization in the 0.1-10 THz range has been a major topic of research since its first demonstration 30 years ago. Advances in terahertz generation, detection, and data acquisition have contributed to improved bandwidth, signal power and signal-to-noise ratio. However, material characterization is still performed using conventional spectroscopic measurement schemes which require detailed information about the test object's shape, location, orientation relative to the measurement system, and a ref… Show more

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Cited by 5 publications
(2 citation statements)
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“…This will reduce the resolution gap between conventional imaging based on focusing optics and terahertz near-field microscopy. Furthermore, the method can be combined with terahertz ellipsometry to determine reference-free material parameters from the images [27]. Additionally, the use of neural networks could enable a classification of the measured material [28].…”
Section: Discussionmentioning
confidence: 99%
“…This will reduce the resolution gap between conventional imaging based on focusing optics and terahertz near-field microscopy. Furthermore, the method can be combined with terahertz ellipsometry to determine reference-free material parameters from the images [27]. Additionally, the use of neural networks could enable a classification of the measured material [28].…”
Section: Discussionmentioning
confidence: 99%
“…Reflections from the backside of the sample can be filtered in the time-domain. Also, a reference free material characterization can be carried out using an ellipsometry measurement setup [29]. As the presented approach is capable of a classification in a certain thickness range, a training with more thicknesses leads possibly to a well-trained network capable of classifying all materials within the trained range.…”
Section: Discussionmentioning
confidence: 99%