Reference-Plane Invariant, Broadband, and Stable Constitutive Parameters Determination of Low-Loss Materials from Transmission-Reflection Measurements Using Variable Parameters

Abstract

A stable and reference-plane invariant non-resonant method has been proposed for the retrieval of constitutive parameters of low-loss materials. A metric function, which includes two variable quantities for decreasing measurement errors arising from reflection scattering measurements of low-loss materials, has been derived for analytical and numerical computations of constitutive parameters. We validated the proposed method by artificially including some measurement errors in reflection scattering parameters and noted that our proposed method decreases such errors considerably with the help of these quantities.

Microwave method for reference-plane-invariant and thickness-independent permittivity determination of liquid materials

“…The following methods can be utilized as a remedy. [34][35][36][37] The method in Ref. 34 can only be applied for high-loss dielectric materials.…”

“…To extend these methods for ε r and μ r measurement of liquid materials, we have recently proposed another technique. 37 Although this technique measures ε r and μ r of liquid materials, it has two shortcomings. First, it requires that the electromagnetic properties and lengths of the plugs used for holding the liquid sample in place within the measurement cell be identical.…”