2000
DOI: 10.1103/physrevb.62.8092
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Reflectance-difference spectroscopy of mixed arsenic-rich phases of gallium arsenide (001)

Abstract: The relationship between the reflectance difference spectra and the atomic structure of arsenic-rich reconstructions of GaAs͑001͒ has been investigated. Scanning tunneling micrographs reveal that a roughening process occurs as the surface structure changes with decreasing arsenic coverage from 1.75 to 0.75 monolayers ͑ML͒. At 1.65 ML As, small pits, one bilayer in depth and having the same c(4ϫ4) reconstruction as the top layer, form in the terraces. At the same time, gallium atoms are liberated to the surface… Show more

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Cited by 32 publications
(22 citation statements)
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“…[28] and the shift of the zero-line observed during oxygen chemisorption. It has been already noted in literature that: (i) P1 and P3 coincide with bulk critical points E 1 and E 0 ′, respectively [15,[17][18][19]21]; (ii) the sign of P1 (positive, according to the assumed expression for RAS signal) is consistent with a higher reflectivity for light polarized along the direction of As-dimers at the surface; (iii) P1 is sensitive to contamination (oxygen [28], hydrogen [31], indium [32], germanium [33]), while P3 is weakly dependent upon surface conditions; (iv) the amplitude of P1 results proportional to the number of As-dimers present at the surface layer [34].…”
Section: Resultsmentioning
confidence: 76%
“…[28] and the shift of the zero-line observed during oxygen chemisorption. It has been already noted in literature that: (i) P1 and P3 coincide with bulk critical points E 1 and E 0 ′, respectively [15,[17][18][19]21]; (ii) the sign of P1 (positive, according to the assumed expression for RAS signal) is consistent with a higher reflectivity for light polarized along the direction of As-dimers at the surface; (iii) P1 is sensitive to contamination (oxygen [28], hydrogen [31], indium [32], germanium [33]), while P3 is weakly dependent upon surface conditions; (iv) the amplitude of P1 results proportional to the number of As-dimers present at the surface layer [34].…”
Section: Resultsmentioning
confidence: 76%
“…In contrast, a well-ordered cð4 Â 4Þ arrangement was observed in STM images for the surfaces prepared using As 2 fluxes [2,3] and metal-organic vapor-phase epitaxy (MOVPE) [16], in which three As-As dimers structure is clearly identified. More interestingly, the shape of RD spectrum measured from the latter surface [16] is quite similar to those measured from the 5. Difference in formation energy per cð4 Â 4Þ unit cell between the Ga and As dimer and As and As dimer models as a function of Ga chemical potential.…”
Section: Resultsmentioning
confidence: 86%
“…After growth, the samples were transferred directly to the UHV system. A J-Y NISEL RDS spectrometer was used to obtain the spectra and transient data [18].…”
Section: à4mentioning
confidence: 99%