2013
DOI: 10.1063/1.4813472
|View full text |Cite
|
Sign up to set email alerts
|

Refractive index dynamics of InAs/GaAs quantum dots

Abstract: The refractive index dynamics of an InAs/InGaAs/GaAs dots-in-a-well semiconductor optical amplifier is calculated and compared with experimental results. The fast and slow recovery timescales together with the behaviour with increasing injection are reproduced and explained in terms of the density of carriers available in upper quantum dot and continuum states. Also, a Coulomb-mediated shift of the dot susceptibility is suggested as responsible for the fast recovery of the phase. (C) 2013 AIP Publishing LLC. (… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
3
0

Year Published

2014
2014
2017
2017

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(3 citation statements)
references
References 20 publications
0
3
0
Order By: Relevance
“…Therefore, it is possible to suppress ES lasing using the active MMI-LD structure. As reported in [20,21], the refractive index of the QD active region n c is changed with injection carriers and temperature. However, this carrier induced refractive index is three times smaller in QD than that in QW.…”
mentioning
confidence: 75%
“…Therefore, it is possible to suppress ES lasing using the active MMI-LD structure. As reported in [20,21], the refractive index of the QD active region n c is changed with injection carriers and temperature. However, this carrier induced refractive index is three times smaller in QD than that in QW.…”
mentioning
confidence: 75%
“…where k b is the Boltzmann constant, E b is the energy difference from the band edge of the well to the band edge of the barrier and T is the temperature [13], respectively. The temperature dependence of the transparency carrier density is included through the relation [14] N tr (T ) = N tr (300) * T 300 (9) At low temperatures, the calculated escape time is large enough to result in the carriers becoming localised in the upper layers because of the large ratio of the capture and the escape times; this causes saturable absorption.…”
Section: Modelmentioning
confidence: 99%
“…We include a temperature dependence for the transparency carrier density, N tr , in order to account for the temperature dependence of the gain in (6). The escape time is calculated from τnormale=τnormalcexpfalse(Enormalb/knormalbTfalse)where k b is the Boltzmann constant, E b is the energy difference from the band edge of the well to the band edge of the barrier and T is the temperature [13], respectively. The temperature dependence of the transparency carrier density is included through the relation [14] Ntrfalse(Tfalse)=Ntrfalse(300false) T300At low temperatures, the calculated escape time is large enough to result in the carriers becoming localised in the upper layers because of the large ratio of the capture and the escape times; this causes saturable absorption.…”
Section: Modelmentioning
confidence: 99%