1984
DOI: 10.1063/1.333377
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Refractive index of In1−xGaxAsyP1−y layers and InP in the transparent wavelength region

Abstract: We have measured the refractive index of InP and of liquid-phase-epitaxy–grown InGaAsP layers on InP in the transparent wavelength region using a Brewster-angle method. The dependence of the refractive index on material composition and light wavelength has been investigated for near-lattice-matched samples and compared with theoretical models. We show that both an interband transition model and a single effective oscillator model can be used to calculate the refractive index if the parameters used in the calcu… Show more

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Cited by 132 publications
(25 citation statements)
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“…This corresponds to an uncertainty on the effective index of 4 × 10 . This is in agreement with the observed variations of index due to the lattice mismatch observed in [16]. = a E 2 + b, where E is the wavelength energy in eV.…”
Section: Discussionsupporting
confidence: 80%
See 1 more Smart Citation
“…This corresponds to an uncertainty on the effective index of 4 × 10 . This is in agreement with the observed variations of index due to the lattice mismatch observed in [16]. = a E 2 + b, where E is the wavelength energy in eV.…”
Section: Discussionsupporting
confidence: 80%
“…In order to estimate the phase mismatch accurately, a precise knowledge of the refractive indices is critical at pump, signal, and idler wavelengths. While the index of InGaAsP lattice matched to InP is well known at 1.55 μm [16][17][18][19][20], to date only one publication deals with its measurement at longer wavelengths [21], and none exists at 3 μm. This makes it crucial to accurately characterize its refractive index up to 3.14 μm, outside of the scope covered by literature data.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, both normalized spectra oscillate around unity, which means that the fringe minima (in the case of AlGaInAs) and maxima (in the case of AlGaAs) are equal to the substrate/air reflection, as it is theoretically expected when the optical thickness of the layer corresponds to an even integer number of a quarter wavelength [5]. To analyze the normalized measurement we need the refractive index data of the substrate, which we have taken from Pettit and Turner for the refraction index of InP [10], whose accuracy have been proven [11,12], whereas in the case of GaAs we used the formula from Afromowitz [13], also confirmed by Gehrsitz et al [14]. Therefore, only the refractive index and the thickness of the layer were released as parameters by using a least square error fit method.…”
Section: Methodsmentioning
confidence: 99%
“…To minimize the coupling length, the gap should be reasonably small but not too small as to pose fabrication difficulty. The effective indices of the supermodes in this directional coupler are calculated using the finite-difference mode solver, taking into account the wavelength dependence of the core refractive index [10]. Figure 4(a) shows the effective indices of TE and TM polarizations for w = 0.4 μm, g = 0.1, and 0.3 μm.…”
Section: Structural Dependencementioning
confidence: 99%