Relative permittivity measurement of thick-filmdielectrics at microwave frequencies

Huang, Hui‐Bin; Free, C.E.; Pitt, Keith; Berzins, A. R.; Shorthouse, G.

doi:10.1049/el:19951243

Cited by 6 publications

(2 citation statements)

References 3 publications

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“…Among various dielectric measurement techniques, resonant cavity perturbation method has been proved to be the most successful and accurate technique for measuring the complex permittivity of low-loss materials (Gallone et al, 1996;Horner et al, 1946;Huang et al, 1995;Janezic and Grosvenor, 1991;Kraszewski and Nelson, 1996;Li et al, 1998;Martinelli et al, 1985;Meng et al, 1995;Parkash et al, 1979;Pohl et al, 1995;Vanzura and Kissick, 1989).…”

Section: Resonant Cavity Perturbation Methodsmentioning

confidence: 99%

Measurement techniques for the evaluation of thick‐film materials used in wireless applications

Tian

Free²

2001

Microelectronics International

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A review of the dielectric measurement techniques that are currently available for the characterization of thick film and LTCC materials at microwave and millimeter wave frequencies is presented. The intention is to show the relative advantages and limitations of the various methods, and to provide some practical guide to the particular technique that is most suitable for a given type of material, for use in a particular application. In addition, a novel slit cavity resonator method is proposed to enable substrate parameters to be more easily measured, whilst retaining high measurement accuracy. Measured data on materials from a variety of manufacturers are presented to show the validity and usefulness of this method.

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Section: Resonant Cavity Perturbation Methodsmentioning

confidence: 99%

Measurement techniques for the evaluation of thick‐film materials used in wireless applications

Tian

Free²

2001

Microelectronics International

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“…The value of Y c is easily obtained from transmission line theory by decomposing the cavity into three sections of waveguide having lengths d, T and (l-T-d), respectively. The condition for resonance is then sm iris H which reduces to the solution of a transcendental equation as given in Huang et al (1995).…”

Section: Measurement Theorymentioning

confidence: 99%

Substrate characterization: simulation and measurement at high microwave frequencies

Free

Tian

Barnwell

2001

Microelectronics International

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In this paper we present new measured loss tangent data for commercially available substrates, and these data are supported by simulations that show how practical variations in loss tangent affect the performance of microwave interconnections and devices. The paper reviews the measurement techniques that are currently available to measure the dielectric constant and loss tangent of substrate materials, and includes a new variation on an existing method that enables substrate parameters to be more easily measured but retains high accuracy. Simulations have been performed on microstrip lines fabricated on 10mil thick substrates using gold conductors to show the relative contributions of conductor and dielectric loss to the total line loss over the frequency range 0‐40GHz. Included in these simulations are the effects of conductor surface roughness. The simulated data are related to measured line microstrip line loss data over the frequency range 50MHz‐40GHz. The measured values, for an etched gold line on alumina, vary from 0.0045dB/mm at 50MHz to 0.04dB/mm at 40GHz.

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Electromagnetic characteristics of carbon nanotube film materials

Zhang

Xiong

Wang

et al. 2015

Chinese Journal of Aeronautics

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Carbon nanotube (CNT) possesses remarkable electrical conductivity, which shows great potential for the application as electromagnetic shielding material. This paper aims to characterize the electromagnetic parameters of a high CNT loading film by using waveguide method. The effects of layer number of CNT laminate, CNT alignment and resin impregnation on the electromagnetic characteristics were analyzed. It is shown that CNT film exhibits anisotropic electromagnetic characteristic. Pristine CNT film shows higher real part of complex permittivity, conductivity and shielding effectiveness when the polarized direction of incident wave is perpendicular to the winding direction of CNT film. For the CNT film laminates, complex permittivity increases with increasing layer number, and correspondingly, shielding effectiveness decreases. The five-layer CNT film shows extraordinary shielding performance with shielding effectiveness ranging from 67 dB to 78 dB in X-band. Stretching process induces the alignment of CNTs. When aligned direction of CNTs is parallel to the electric field, CNT film shows negative permittivity and higher conductivity. Moreover, resin impregnation into CNT film leads to the decrease of conductivity and shielding effectiveness. This research will contribute to the structural design for the application of CNT film as electromagnetic shielding materials.

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Relative permittivity measurement of thick-filmdielectrics at microwave frequencies

Cited by 6 publications

References 3 publications

Measurement techniques for the evaluation of thick‐film materials used in wireless applications

Measurement techniques for the evaluation of thick‐film materials used in wireless applications

Substrate characterization: simulation and measurement at high microwave frequencies

Electromagnetic characteristics of carbon nanotube film materials

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