2018
DOI: 10.1016/j.microrel.2018.07.079
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Reliability evaluation of IGCT from accelerated testing, quality monitoring and field return analysis

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Cited by 5 publications
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“…For such applications and because of the low switching frequency of the individual semiconductor power switches provided by the large number of levels, the replacement of the insulated-gate bipolar transistor (IGBT) by the integrated gatecommutated thyristor (IGCT) appears to be advantageous [5] because the IGCT has low on-state losses, inherent short-circuit failure-mode (SCFM) and higher reliability [6][7][8] with improved thermal cycling capabilities [9,10]. The use of this device for…”
Section: Introductionmentioning
confidence: 99%
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“…For such applications and because of the low switching frequency of the individual semiconductor power switches provided by the large number of levels, the replacement of the insulated-gate bipolar transistor (IGBT) by the integrated gatecommutated thyristor (IGCT) appears to be advantageous [5] because the IGCT has low on-state losses, inherent short-circuit failure-mode (SCFM) and higher reliability [6][7][8] with improved thermal cycling capabilities [9,10]. The use of this device for…”
Section: Introductionmentioning
confidence: 99%
“…For such applications and because of the low switching frequency of the individual semiconductor power switches provided by the large number of levels, the replacement of the insulated-gate bipolar transistor (IGBT) by the integrated gatecommutated thyristor (IGCT) appears to be advantageous [5] because the IGCT has low on-state losses, inherent short-circuit failure-mode (SCFM) and higher reliability [6][7][8] with improved thermal cycling capabilities [9,10]. The use of this device for MMC-HVDC applications is being intensively investigated in China [11][12][13], where many multi-terminal HVDC links have been installed over the last ten years with a growing interest in coupling LCC technology with VSC-MMC solutions [14].…”
Section: Introductionmentioning
confidence: 99%