2008 Second International Conference on Thermal Issues in Emerging Technologies 2008
DOI: 10.1109/theta.2008.5167181
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Reliability evaluation on deterioration of power device using coupled electrical-thermal-mechanical analysis

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Cited by 7 publications
(1 citation statement)
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“…Loh et al [13] discovered several models exhibiting mechanical behavior similarity when the stress level was calculated by the full FE model and by the wire loop-removed FE model. Anzawa et al [14] compared the two types of internal connectors, bonding wire and lead frame, using the thermal-electrical and thermalstructure FE analysis mentioned earlier. Ramminger et al [15] utilized the plastic strain calculated by coarse model and enlarged sub-models, together with the Coffin-Manson relation, to predict the thermal fatigue life of wire.…”
Section: Fatigue Model Of Bonding Wirementioning
confidence: 99%
“…Loh et al [13] discovered several models exhibiting mechanical behavior similarity when the stress level was calculated by the full FE model and by the wire loop-removed FE model. Anzawa et al [14] compared the two types of internal connectors, bonding wire and lead frame, using the thermal-electrical and thermalstructure FE analysis mentioned earlier. Ramminger et al [15] utilized the plastic strain calculated by coarse model and enlarged sub-models, together with the Coffin-Manson relation, to predict the thermal fatigue life of wire.…”
Section: Fatigue Model Of Bonding Wirementioning
confidence: 99%