Reliability growth and forecasting for critical hardware through accelerated life testing

Acevedo, Pablo E.; Jackson, Donald S.; Kotlowitz, R.W.

doi:10.1002/bltj.20183

Cited by 17 publications

(16 citation statements)

References 7 publications

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“…Although some facets of this approach were taken from multiple sources, such as Crow 3 , Levitin 1 , and Acevedo et al 4 , new aspects were used in developing this four-phase approach: component-level testing (including HALT), parallel testing, mechanical design margin testing and RET at the product-level testing phase. These additional aspects are (i) Component-level testing performed as much as possible as soon as hardware was available as recommended by Crow 3 and referenced as well by Levitin 1 ; (ii) Parallel testing at the component level performed based on hardware availability to uncover issues and reduce total testing time in the schedule; (iii) Non-operating testing on mechanical assemblies incorporated to determine design margin; (iv) HALT techniques at the component-level testing used with fixturing to replace any components that were not available as defined in Acevedoet al 4 and (v) The RET methodology was used as described in Case 9 and also supported by Walls et al 10 .…”

Section: Resultsmentioning

confidence: 99%

“…Utilizing the concept of ALT, as described by Acevedo et al 4 , served to reduce the amount of time necessary to obtain the data needed to ensure compliance to the requirements. Acevedo used this methodology for two different testing efforts and it was incorporated into this approach.…”

Section: Methodsmentioning

confidence: 99%

“…The same is performed for production process failures for which there is a definitive configuration. As Acevedo et al 4 stated, Lucent Technology uses the technique of ALT as the primary method of evaluating potential product weaknesses early in the development cycle before volume manufacturing to maximize the product lifetime and reliability.…”

Section: Introductionmentioning

confidence: 98%

See 2 more Smart Citations

An approach that can quickly assess product reliability

Zanoff

Ekwaro-Osire

2009

Quality & Reliability Eng

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One of the ways to determine the inherent reliability of a design is to test it under controlled environments based on the product usage that is understood by the development requirements. This can be accomplished by performing a reliability growth test on the product. A testing approach can be developed that enhances the product reliability and reduces the production testing cycle. Research performed to date points to the fact that this proposed methodology may not exist, and is the focus of continued research to refine the development of an approach to fill this gap. The combining of multiple testing approaches in order to ensure that the reliability requirement is met or exceeded while at the same time having the capability to reduce the testing cycle time when required due to schedule and cost constraints has not been addressed in the open literature till date. The methodology is to utilize a combination of multiple testing approaches to accomplish this task by exploring complementary testing ideas from various technologies that have been utilized previously with documented success. This approach demonstrated that component-level testing reduced the product-level failures by greater than 80% while at the same time reducing the schedule to complete all testing.

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Section: Resultsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 98%

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An approach that can quickly assess product reliability

Zanoff

Ekwaro-Osire

2009

Quality & Reliability Eng

View full text Add to dashboard Cite

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“…This model is interesting particularly when the performance of component depends from thermo-physical and chemical conditions. Acevedo et al [19] apply Arrhenius model in ALT analyses on the RF power amplifiers. Another common used life-stress relationship is the Inverse Power Law.…”

Section: Introductionmentioning

confidence: 99%

Reliability Prediction of a Mechanical Component Through Accelerated Life Testing

Regattieri¹,

Casto²,

Piana³

et al. 2018

dtetr

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The reliability prediction (i.e. life prediction) of components and subsystems is a crucial issue for the efficiency of production systems. This paper presents a reliability assessment method, applied to a mechanical component (i.e. gear unit) of an automated manufacturing system. Study is based on accelerated life test approach (ALT). In the study authors used General log-linear model (GLL) combined with a Weibull distribution for time to failures. Researchers did different experimental tests in the laboratory of the Department of Industrial Engineer -University of Bologna, to estimate model parameters. Expected life of component was then evaluated using the proposed ALT model. Finally, results are compared with actual time-to-failure data coming from field. Time-to-failure was collected during about 10 years, on about 20 production lines using the same gear unit. The accordance between real data and life prediction is satisfying. Results confirm Accelerated Life Testing (ALT) is an efficient and effective assessment method for lifetime prediction based on short time tests.

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“…Feinberg provided closed‐form equations to incorporate ALT with the Crow‐AMSAA model by using a constant time scaling factor that captures the equivalence between the testing times under the normal and harsher‐than‐normal conditions. Feinberg's ALT‐extended Crow‐AMSAA model has been applied in industry for relatively simple electronic components . Although constant time scaling is mathematically convenient, concerns about its practicality motivate the development of various parametric and nonparametric acceleration models for determining equivalence between the results from ALT and the normal use condition.…”

Section: Introductionmentioning

confidence: 99%

A Bayesian framework for accelerated reliability growth testing with multiple sources of uncertainty

Ruiz

Pohl

Liao

et al. 2018

Quality & Reliability Eng

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Reliability growth tests are often used for achieving a target reliability for complex systems via multiple test‐fix stages with limited testing resources. Such tests can be sped up via accelerated life testing (ALT) where test units are exposed to harsher‐than‐normal conditions. In this paper, a Bayesian framework is proposed to analyze ALT data in reliability growth. In particular, a complex system with components that have multiple competing failure modes is considered, and the time to failure of each failure mode is assumed to follow a Weibull distribution. We also assume that the accelerated condition has a fixed time scaling effect on each of the failure modes. In addition, a corrective action with fixed ineffectiveness can be performed at the end of each stage to reduce the occurrence of each failure mode. Under the Bayesian framework, a general model is developed to handle uncertainty on all model parameters, and several special cases with some parameters being known are also studied. A simulation study is conducted to assess the performance of the proposed models in estimating the final reliability of the system and to study the effects of unbiased and biased prior knowledge on the system‐level reliability estimates.

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Reliability growth and forecasting for critical hardware through accelerated life testing

Cited by 17 publications

References 7 publications

An approach that can quickly assess product reliability

An approach that can quickly assess product reliability

Reliability Prediction of a Mechanical Component Through Accelerated Life Testing

A Bayesian framework for accelerated reliability growth testing with multiple sources of uncertainty

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