Reliability modeling for mutually dependent competing failure processes due to degradation and random shocks

Hao, Songhua; Yang, Jun; Ma, Xiaobing; Zhao, Yu

doi:10.1016/j.apm.2017.06.014

Cited by 113 publications

(50 citation statements)

References 29 publications

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“…Other models considering a changing degradation rate are available in the literature such as Bian and Gebraeel. [6], Rasmekomen and Parlikad [49], Hao et al [14,18,51]. Yet, for all of the models, the idea that the amplitude of the shocks, internal and external, can vary or be random, needs to be studied further.…”

Section: State-based Interactionmentioning

confidence: 99%

Failure interaction models for multicomponent systems: a comparative study

Meango

Ouali

2018

SN Appl. Sci.

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Classical reliability models consider the failure modes of a multicomponent system as independent phenomena, even if these modes concern only one component or neighbouring components. In fact, when a failure mode occurs on a given system, causes may be related to external events or to the physical degradation of any component in the system. In both cases, failure modes can partially or totally share some root causes, which may compromise the principle of independence of failure modes. This paper reviews the failure interaction models that characterise the effect of any failure mode of a component on the failure modes of its neighbors and on the entire system. Three relevant groups of interaction models are reviewed: reliability indexes' interaction, state-based interaction and copula-based interaction. All these models share the hypothesis of stochastic dependence between failure modes, also referred to as failure interaction. They differ in their fundamental modeling concepts. Advantages and limits of each of them are emphasized in a comparative study dealing with dependency concepts, modeling methods and application domains.

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Section: State-based Interactionmentioning

confidence: 99%

Failure interaction models for multicomponent systems: a comparative study

Meango

Ouali

2018

SN Appl. Sci.

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“…They found the reliability was weakened significantly as considering mutual dependence. Hao SH et al [31] took advantage of Stress-Strength models and Cumulative damage model to study above similar problem. Cao YS et al [32]explored the two dependent and competing failure processes in the context of multi-state systems with multiple components, and obtained reliability functions.…”

Section: Introductionmentioning

confidence: 99%

Study on Chip Reliability Modeling Based on Mutually Dependent Competing Failure of Solder Joints in Different Failure Modes

Jing

et al. 2020

IEEE Access

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“…Some research work discussed a mix of different types of shocks. Hao et al [23] proposed a degradation model for mutually dependent competing failure processes due to degradation and random shocks. Random shocks considered in this model are extreme shocks and cumulative shocks.…”

Section: Introductionmentioning

confidence: 99%

Reliability assessment considering stress drift and shock damage caused by stress transition shocks in a dynamic environment

Huang

Peng

Zhao

et al. 2019

Journal of Systems Engineering and Electronics

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Products are often subject to dynamic environmental conditions in field use. When stress transition occurs, products may be exposed to instantaneous shocks that result in shock damages to the products, causing a permanent change of the degradation signals. Meanwhile, under some conditions, instantaneous shocks also lead to stress drift, causing a temporary change of the degradation signals. In this paper, a degradation model is proposed to assess the reliability and predict the residual lifetime of products operating in a dynamic environment considering shock damage and stress drift. The model is established based on a Wiener process which combines a stress-dependent degradation rate function, a shock damage function and a stress drift function in response to the dynamic environment. The shock damage function is established as a linear function of the stress transition start level and the stress level increment. The stress drift function is established as the difference value of a specified function at the stress transition start and end levels. A simulation study is presented to demonstrate the application of the model, and a case study for miniature light bulbs is used to validate the effectiveness of the proposed model.

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Reliability modeling for mutually dependent competing failure processes due to degradation and random shocks

Cited by 113 publications

References 29 publications

Failure interaction models for multicomponent systems: a comparative study

Failure interaction models for multicomponent systems: a comparative study

Study on Chip Reliability Modeling Based on Mutually Dependent Competing Failure of Solder Joints in Different Failure Modes

Reliability assessment considering stress drift and shock damage caused by stress transition shocks in a dynamic environment

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