Reliability of MEM relays for zero leakage logic

Chen, Yenhao; Nathanael, Rhesa; Yaung, Jack; Hutin, Louis; Liu, Tsu‐Jae King

doi:10.1117/12.2005719

Cited by 13 publications

(6 citation statements)

References 13 publications

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“…Researchers at the University of California, Berkeley has developed 4-and 6-terminal relays that exhibits steep switching behavior, hysteresis, and a large on/off current ratio [5], [6], [62]. In principle, this configuration has the potential to operate at extremely low voltages and may be able to use less energy than CMOS logic [63].…”

Section: Logic Switches and Gatesmentioning

confidence: 99%

The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)

Arutt

Alles

Liao

et al. 2016

Semicond. Sci. Technol.

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The potential of micro and nano electromechanical systems (M and NEMS) has expanded due to advances in materials and fabrication processes. A wide variety of materials are now being pursued and deployed for M and NEMS including silicon carbide (SiC), III-V materials, thinfilm piezoelectric and ferroelectric, electro-optical and 2D atomic crystals such as graphene, hexagonal boron nitride (h-BN), and molybdenum disulfide (MoS 2 ). The miniaturization,

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Section: Logic Switches and Gatesmentioning

confidence: 99%

The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)

Arutt

Alles

Liao

et al. 2016

Semicond. Sci. Technol.

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“…Fig. 5 shows how |V PI,+ | -|V PI,-| and |V RL,+ | -|V RL,-| evolve with the number of on/off cycles [16] for a prototype …”

Section: B Dielectric Chargingmentioning

confidence: 99%

Reliable micro-electro-mechanical (MEM) switch design for ultra-low-power logic

Kam

Chen

Liu

2013

2013 IEEE International Reliability Physics Symposium (IRPS)

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Fundamental energy-efficiency limits for transistorbased digital logic circuits have led to renewed interest in microelectro-mechanical (MEM) switches [1-12] because they have the ideal characteristics of zero off-state leakage and abrupt switching behavior. Reliable operation with high endurance is a key requirement for digital logic applications, and historically has been a challenge for mechanical computing devices. This paper discusses various failure modes for MEM switches, with particular focus on contact stiction due to welding. Experimental results show that device endurance (number of on/off switching cycles before welding-induced failure) improves exponentially with decreasing contact temperature, and that it depends on the contact material, contact voltage (V C ), on-state resistance (R ON ) and load capacitance.A contact reliability model calibrated to the experimental data projects that endurance will exceed 10 15 cycles at 1V operating voltage. Implications for switch contact design, logic applications and dimension scaling are discussed.Energy-efficient electronics, MEM switches, steeply switching logic devices.

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“…A nanoelectromechanical (NEM) switch is one of the promising candidates beyond CMOS [2,[4][5][6][7][8], which takes advantage of the reduced leakage current, and therefore the reduced power consumption and the higher on:off ratio [4]. Moreover, nanoelectromechanical system (NEMS) switches have broad potential applications in extreme environments, such as in exploring aerospace and rescuing nuclear accidents, due to their tolerance to radiation [2], temperature variations [9], and external electric fields [10].…”

Section: Introductionmentioning

confidence: 99%

Designing a Double-Pole Nanoscale Relay Based on a Carbon Nanotube: A Theoretical Study

Ouyang

Dresselhaus

2017

Phys. Rev. Applied

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We theoretically investigate a novel and powerful double-pole nanoscale relay based on a carbon nanotube, which is one of the nanoelectromechanical switches being able to work under the strong nuclear radiation, and analyze the physical mechanism of the operating stages in the operation, including "pull in," "connection," and "pull back," as well as the key factors influencing the efficiency of the devices. We explicitly provide the analytical expression of the two important operation voltages, V pull in and V pull back , therefore clearly showing the dependence of the material properties and geometry of the present devices by the analytical method from basic physics, avoiding complex numerical calculations. Our method is easy to use in preparing the design guide for fabricating the present device and other nanoelectromechanical devices.

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Reliability of MEM relays for zero leakage logic

Cited by 13 publications

References 13 publications

The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)

The study of radiation effects in emerging micro and nano electro mechanical systems (M and NEMs)

Reliable micro-electro-mechanical (MEM) switch design for ultra-low-power logic

Designing a Double-Pole Nanoscale Relay Based on a Carbon Nanotube: A Theoretical Study

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