2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) 2013
DOI: 10.1109/qr2mse.2013.6625601
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Reliability research for PV system using BDD-based fault tree analysis

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Cited by 9 publications
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“…Researchers such as; Huffman [1], Hamdy et al [2] and Graaff et al [3] investigated on significant issues concerning the reliability, and safety of PV systems, RAM study of large-scale grid-connected solar-PV systems is conducted using a range of reliability approaches. Zhang et al [4] and Hu et al [5] conduct reliability block diagram (RBD) and fault tree analysis (FTA). In the sense of an FTA, the physical structure is translated into a logical diagram, with each block representing a device part.…”
Section: Introductionmentioning
confidence: 99%
“…Researchers such as; Huffman [1], Hamdy et al [2] and Graaff et al [3] investigated on significant issues concerning the reliability, and safety of PV systems, RAM study of large-scale grid-connected solar-PV systems is conducted using a range of reliability approaches. Zhang et al [4] and Hu et al [5] conduct reliability block diagram (RBD) and fault tree analysis (FTA). In the sense of an FTA, the physical structure is translated into a logical diagram, with each block representing a device part.…”
Section: Introductionmentioning
confidence: 99%
“…RAM analysis of large scale grid-connected solar-PV systems is carried out using several reliability methods. Among them, as seen in earlier reliability work, reliability block diagram (RBD), and fault tree analysis (FTA) [10][11][12][13]. In FTA, the physical layout is interpreted into a logical diagram whereby each block represents a system component.…”
Section: Introductionmentioning
confidence: 99%
“…The analysis of LSPVSs is commonly carried out using a fault tree analysis (FTA), as seen in early [14] and more recent [15,16] reliability work. FTAs are used to interpret a physical layout (such a PV system) into a logical diagram (block diagram) whereby each block represents a system component, described by its failure rate.…”
Section: Introductionmentioning
confidence: 99%