2010 12th Electronics Packaging Technology Conference 2010
DOI: 10.1109/eptc.2010.5702637
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Reliability testing of electronic packages in harsh environments

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Cited by 12 publications
(7 citation statements)
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“…As reported previously [6], [7], [8], the orientation of the wires in respect to the axis of the vibration, results in different failure modes.…”
Section: Mechanical Deformation Of Bonded Wires Due To High Temperatumentioning
confidence: 78%
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“…As reported previously [6], [7], [8], the orientation of the wires in respect to the axis of the vibration, results in different failure modes.…”
Section: Mechanical Deformation Of Bonded Wires Due To High Temperatumentioning
confidence: 78%
“…Initial work has been reported by the authors to understand the effects of combined vibration and thermal loadings on wire bonded electronic devices in order to assist to the understanding of the significant degradation due to the combined testing conditions [6][7] [8].…”
Section: Introductionmentioning
confidence: 99%
“…3. Vibration combined with other downhole factors such as temperature, shock, and resonance have a damaging impact on drilling tool failure and lifetime [4,21,47,[66][67][68]. Table 2 lists research efforts on applying vibration factor in reliability modeling and predictions based on FRBD by statistical modeling, Bayesian method, data mining, Monte Carlo simulation, advanced computing, and analytics methods [17,69,70].…”
Section: Drill String Modeling Optimization Systemmentioning
confidence: 99%
“…Drilling electronics operate in extremely harsh downhole environments with temperatures exceeding 150C, shock and vibration levels exceeding 15g. The impact of temperature, shock and vibration on the life of electronics is described by Barker et al (1992), Duffek (2004), Garvey et al (2009), Gingerich et al (1999), Lall et al (2005Lall et al ( , 2007, Mirgkizoudi et al (2010), Pecht et al (1999), Vichare (2006), Vijayaragavan (2003), Wassell & Stroehlein (2010), White & Bernstein (2008). Other factors like power cycles, thermal ramp rates, electrical overstress, mechanical stress and manufacturing defects impact reliability of tools, but the factors cannot be accurately measured in downhole drilling environments and encompass high uncertainty.…”
Section: Introductionmentioning
confidence: 99%
“…These factors can act alone or interact with each other to produce several degradation mechanisms that can cause failure. For example, Mirgkizoudi et al (2010) demonstrated through tests that there is significant difference between the lives of electronic components subjected to thermal testing with vibration as compared to those with pure thermal loading. Failure of electronics because of fatigue, corrosion, electromigration, filament formation and dielectric breakdown has been established by the scientific community (e.g.…”
Section: Introductionmentioning
confidence: 99%