2010
DOI: 10.1016/j.sse.2010.05.034
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Reliable procedure for electrical characterization of MOS-based devices

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Cited by 12 publications
(3 citation statements)
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“…This procedure calculates a total of N = k−1 i=1 i = k (k − 1)/2 points z i, j in the k-dimensional objective space (i.e., N = 1, 3, and 6 points for k = 2, 3, and 4) from k initially known vertices of the reference set. Much more details about this procedure can be found in [21], and a mathematical proof of the asymptotic uniformity of the coverage is given in [22].…”
Section: Suggested Methods For An Assymptotically Uniform Coverage Of mentioning
confidence: 99%
“…This procedure calculates a total of N = k−1 i=1 i = k (k − 1)/2 points z i, j in the k-dimensional objective space (i.e., N = 1, 3, and 6 points for k = 2, 3, and 4) from k initially known vertices of the reference set. Much more details about this procedure can be found in [21], and a mathematical proof of the asymptotic uniformity of the coverage is given in [22].…”
Section: Suggested Methods For An Assymptotically Uniform Coverage Of mentioning
confidence: 99%
“…The objective function f P is minimized using our original modification of the Levenberg-Marquardt method [6], which consists in normalizing the Jacobian matrix for suppressing numerical instability. The LevenbergMarquardt method is used to obtain solutions for chosen values of w i and P in (12).…”
Section: A Usage Of the Goal Attainment Methodsmentioning
confidence: 99%
“…For circuit simulations, our original C.I.A. tool [6] was used with large efficiency enhancement by fill-in suppression.…”
Section: A Usage Of the Goal Attainment Methodsmentioning
confidence: 99%