2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) 2015
DOI: 10.1109/dft.2015.7315139
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REPAIR: Hard-error recovery via re-execution

Abstract: Processor reliability at upcoming technology nodes presents significant challenges to designers from increased manufacturing variability, parametric variation and transistor wearout leading to permanent faults. We present a design to tolerate this impact at the microarchitectural level-a chip with n cores together with one or more shared instruction re-execution units (IRUs). Instructions using a faulty component are identified and re-executed on an IRU. This design incurs no slowdown in the absence of errors … Show more

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