Research on the Randomly Phase Shifting Algorithm with Wavelength Tuning

Renhui, 郭仁慧 Guo; Jianxin, 李建欣 Li; Rihong, 朱日宏 Zhu; Lei, 陈磊 Chen

doi:10.3788/cjl201239.0508002

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2014

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“…In practice, all cavities produce multiple-beam interference at some level. The interferogram from unwanted surface reflections make it difficult to acquire the accurate surface profile of transparent parallel plates which are of great interests to the optics, display and telecommunication industries [2][3][4] . To overcome this problem, most attempts to suppress the unwanted surface reflection by applying index matching lacquers on the offending surface to reduce the reflected amplitude [5] .…”

Section: Introductionmentioning

confidence: 99%

Analyses of multiple surfaces transform interferometry in parallel plate measurement

et al. 2014

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Multiple surfaces transform interferometery is a preferred technology for surface profile and index homogeneity measurement using a Fourier based analysis method combined with phase-shifting interferometer. As a four-surface cavity for example, the surface form and index inhomogeneity of the parallel plate are deduced by extracting the information from the corresponding interference frequency. The errors of surface form and index homogeneity are simultaneously simulated and analyzed with different sampling buckets. The results show the feasibility and high precision of this approach compared with traditional methods.Multiple surface transform interferometry; Fourier based analysis method; phase-shifting interferometer; surface profile; index inhomogeneity;

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Section: Introductionmentioning

confidence: 99%