Residual gas analysis based on carbon nanotube field emission display

Wang, Jinchan; Zhang, Xiaobing; Lei, Wei; Xiao, Mao; Cui, Yunkang; Di, Yunsong; Mao, Fuming

doi:10.1116/1.2715970

Cited by 9 publications

(5 citation statements)

References 12 publications

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“…On the other hand, the ion bombardment is largely dependent on the outgassing of molecules during the field electron emission operation. In general, the outgassing of gas molecules in the CNT paste emitter is closely related to the thermal decomposition of the binder material. , Therefore, we suggest that the better the thermal stability of the binder material, the lower the degradation rate of electron emission current during the long-term emission stability test. The adsorption and desorption of gas molecules mainly cause the fluctuation of electron emission current. , The adsorbed gas molecules increase the electron emission current, but some molecules like oxygen and carbon monoxide can cause a degradation in the electron emission current. , Therefore, it is understood that the better the thermal stability of the binder material, the lower the fluctuation rate of electron emission current during the long-term emission stability test.…”

Section: Resultsmentioning

confidence: 87%

“…In general, the outgassing of gas molecules in the CNT paste emitter is closely related to the thermal decomposition of the binder material. 42,43 Therefore, we suggest that the better the thermal stability of the binder material, the lower the degradation rate of electron emission current during the long-term emission stability test. The adsorption and desorption of gas molecules mainly cause the fluctuation of electron emission current.…”

Section: Resultsmentioning

confidence: 95%

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Improved Field Emission Properties of Carbon Nanotube Paste Emitters Using an Electrically Conductive Graphite Binder

Go,

Han,

Lee

et al. 2024

ACS Appl. Electron. Mater.

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Field electron emission properties of carbon nanotube (CNT) paste emitters have been investigated according to binder materials such as acrylic binder, polymethyl methacrylate (PMMA) binder, ethyl cellulose (EC) binder, and graphite binder. Out of the four CNT paste emitters, the graphite binder-based CNT paste emitter demonstrates the best field emission performance, followed by the EC binder, PMMA binder, and acrylic binder in sequence. The obtained result indicates that the field emission properties of the CNT paste emitter are improved with an increase in the electrical conductivity of the binder material. The graphite binder-based CNT paste emitter exhibits a low turn-on field of 3.13 V/μm and a high field emission current density of 882.28 mA/cm2 (corresponding to a current of 50.52 mA) at an applied electric field of 6.7 V/μm. In addition, the graphite binder-based CNT paste emitter shows good emission stability after 10 h of operation with a high initial current density of 122.26 mA/cm2, including a low current degradation rate of 4.84% and a low current fluctuation rate of ±0.59%. The good electron emission stability of the graphite binder-based CNT paste emitter is mainly caused by both the higher electrical conductivity and the higher thermal stability of the graphite binder compared with organic binder materials. The experimental results have shown that the graphite binder-based CNT paste emitter can be widely used in various vacuum electronic devices.

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Section: Resultsmentioning

confidence: 87%

Section: Resultsmentioning

confidence: 95%

Improved Field Emission Properties of Carbon Nanotube Paste Emitters Using an Electrically Conductive Graphite Binder

Go,

Han,

Lee

et al. 2024

ACS Appl. Electron. Mater.

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“…In addition, there is another method to produce O 2 from the decomposition of ZnO under ion bombardment. [11] Element According to the above analysis, it is clear that the residual gases and outgassing components are partially different between the FE devices using MWCNT emitters [12] and the tetrapod ZnO emitters. This difference is mainly due to the interaction between different cathode materials and the ambient gases in the fabrication or operation process of the device.…”

Section: Resultsmentioning

confidence: 99%

Residual gas properties in a field emission device with ZnO emitters

Wang¹

2013

Chinese Phys. B

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In this paper, a vacuum system is employed to compare the emission stabilities of the same ZnO cathode in a sealed field emission (FE) device and under ultrahigh vacuum (UHV) conditions. It is observed that the emission current is more stable under the UHV level than in the device. When all conditions except the ambient gases are kept unchanged, the emission current degradation is mainly caused by the residual gases in the sealed device. The quadrupole mass spectrometer (QMS) equipped on the vacuum system is used to investigate the residual gas components. Based on the obtained QMS data, the following conclusions can be drawn: the residual gases in ZnO-FE devices are H2, CH4, CO, Ar, and CO2. These residual gases can change the work function at the surface through adsorption or ion bombardment, thereby degrading the emission current of the cathode.

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“…10 Part of the gas molecules are ionized due to the collision between electrons and gas molecules. The pressure in the devices is also increased due to the gas desportion.…”

Section: Introductionmentioning

confidence: 99%

Effect of ion bombardment on the field emission property of tetrapod ZnO

Cui

Zhang

Lei

et al. 2010

Journal of Applied Physics

Self Cite

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The influences of ion bombardment on the field emission performance of tetrapod ZnO nanostructures are reported. As the scanning electron microscopy images and photoluminescence spectrum show, the tips of the field emitters are destroyed and the surface state of the field emitters is also changed after the ion bombardment. The ion bombardment has a considerable effect on the field emission properties of the tetrapod ZnO field emitters. After Ar + ion bombardment with the energy of 3 keV and the ion current of 0.05 A for 30 min, the turn-on field increases about 63% and the threshold field increases about 77%, respectively. There are two main reasons for the variation in field-emission property: ͑1͒ the decrement of the field enhancement factor ␤, which is caused by the variation in morphology of field emitter; ͑2͒ the increment of work function , which is caused by the changed concentration of the surface oxygen vacancy.

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Residual gas analysis based on carbon nanotube field emission display

Cited by 9 publications

References 12 publications

Improved Field Emission Properties of Carbon Nanotube Paste Emitters Using an Electrically Conductive Graphite Binder

Improved Field Emission Properties of Carbon Nanotube Paste Emitters Using an Electrically Conductive Graphite Binder

Residual gas properties in a field emission device with ZnO emitters

Effect of ion bombardment on the field emission property of tetrapod ZnO

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