Residual stress analysis of multi-layered buffer layers on Ni substrate for YBCO coated conductor

Arda, L.; Ataoglu, S.; Sezer, Semih; Abdulaliyev, Z.

doi:10.1016/j.surfcoat.2007.06.008

Cited by 18 publications

(11 citation statements)

References 26 publications

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“…We refer them as b and c, respectively. The stress components in the direction of the normal to the interfaces of different materials can be assumed to be zero [17]. The width (1 cm) of Ni substrate is relatively big to its own thickness.…”

Section: Analysis Of Residual Stressesmentioning

confidence: 99%

“…There are a lot of works related to texture and microstructure properties of buffer layers and YBCO, which depend on processing conditions and methods [15,16], but very few studies have been reported about the effects of residual stress on those properties [17,18]. It is available to calculate residual stress in films using various methods such as numerical, analytical, hole drilling, layer removal, curvature, displacement, fracture, strain, neutron and X-ray diffraction (XRD) [19,20].…”

Section: Introductionmentioning

confidence: 99%

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Effect of temperature and film thickness on microstructure and residual stress for YbBCO-coated conductors

Arda

Ataoglu

2009

Journal of Alloys and Compounds

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Section: Analysis Of Residual Stressesmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Effect of temperature and film thickness on microstructure and residual stress for YbBCO-coated conductors

Arda

Ataoglu

2009

Journal of Alloys and Compounds

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“…Among these methods, sol-gel method can be performed at room temperature, which is advantageous because it is more homogeneous, inexpensive, simple method to control the composition of nano particle and films [15][16][17][18]. Nevertheless, the sol-gel nanoparticles and & E. Asikuzun easikuzun@kastamonu.edu.tr films have some failures which stem from the processing parameters, drying, heat treatment and annealing condition [19][20][21]. These failures establish stress based on the difference in the physical and mechanical properties of the elements that connect temperature regime of the product of the nanoparticles.…”

Section: Introductionmentioning

confidence: 99%

Preparation, structural and micromechanical properties of (Al/Mg) co-doped ZnO nanoparticles by sol–gel process

Asikuzun

Öztürk

Arda

et al. 2015

J Mater Sci: Mater Electron

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Zn 0.90 Mg 0.10-x Al x O (x = 0.0, 0.1, 0.2, 0.3, 0.4, 0.5 and 0.10) nanoparticles were prepared by using sol-gel technique. The effects of Al and Mg doping on the structural and mechanical properties were investigated by using X-Ray diffraction (XRD), scanning electron microscopy (SEM) and digital micro-hardness tester, respectively. The grain size, a and c lattice parameters and morphology of nanoparticles were characterized by XRD and SEM measurements. The grain sizes of Al/Mg co-doped ZnO nanoparticles were also calculated by Scherrer-Warren equation. a and c lattice parameters are calculated from XRD peaks. According to the results it was observed that the grain sizes increased with increasing the Al doping. c lattice parameter partially decreased with Al doping. The experimental results of hardness measurements were analyzed using Meyer's law, proportional specimen resistance model, elastic/plastic deformation model, and Hays-Kendall (HK) approach. It was observed that HK approach is the most successful model for the micro-hardness analysis of Al/Mg co-doped ZnO materials.

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“…Second generation (2G) high temperature superconductor (HTS) coated conductors (CC) with high critical current density (Jc) are attractive for various electric power applications, such as cables, motors, generators and magnets [1][2][3]. In recent years, a great deal of effort has been invested in studying growth behavior and the preparation of thick film in coated conductors, which are multi-layer composite materials composed of metal substrate/buffer layer/superconducting layer/protective layer, in order to guarantee a sufficient barrier function against metal and oxygen diffusion as well as obtain high-quality CC tape [4,5].…”

Section: Introductionmentioning

confidence: 99%

Growth of thick MOD-derived CeO2−x buffer layer with less residual carbon for coated conductors

Wang

Cao

Wang

et al. 2015

J Mater Sci: Mater Electron

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120 nm thick CeO 2-x buffer layer with less residual carbon has been prepared on biaxially textured NiW substrate using a newly developed heat-treatment route by a metal organic deposition approach. The thickness enhancement of CeO 2-x buffer layer was achieved by multiple coatings. The residual carbon removal in CeO 2-x buffer layer was realized by introducing CO 2 into annealing atmosphere at the post-annealed step. Various characteristic methods, including X-ray diffraction, X-ray photoelectron spectra, emission scanning electron microscopy and atomic force microscopy analyses techniques have been applied to investigate the performance of CeO 2-x film. The results show that thick high-quality textured CeO 2-x film with smooth and crack-free surface has been produced at annealing temperature below 1000°C. Furthermore, the atomic concentration of C in such thick CeO 2-x buffer layer prepared using the postannealed step by introducing CO 2 into annealing atmosphere is obviously less than that in CeO 2-x film fabricated in reducing atmosphere of Ar-4 % H 2 . In addition, the introduction of CO 2 into post-annealing step is helpful to the decrease of oxygen vacancy defects in CeO 2-x film, which can suppress the generation of cracks in film. It suggests that CeO 2-x film fabricated by the newly developed heat-treatment route is proved to be a strong candidate as a buffer layer used for the further growth of the oxide film in coated conductors.

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Residual stress analysis of multi-layered buffer layers on Ni substrate for YBCO coated conductor

Cited by 18 publications

References 26 publications

Effect of temperature and film thickness on microstructure and residual stress for YbBCO-coated conductors

Effect of temperature and film thickness on microstructure and residual stress for YbBCO-coated conductors

Preparation, structural and micromechanical properties of (Al/Mg) co-doped ZnO nanoparticles by sol–gel process

Growth of thick MOD-derived CeO2−x buffer layer with less residual carbon for coated conductors

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