2014
DOI: 10.1063/1.4890339
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Residual stress induced crystalline to amorphous phase transformation in Nb2O5 quantum dots

Abstract: Nb2O5 quantum dots (QDs) were grown using a simple technique of vacuum thermal evaporation. QDs were found to be crystalline in nature by selected area electron diffraction (SAED) in TEM. Samples with thickness up to 20 nm did not show any significant residual strain. Residual stress effect on band gap of crystalline Nb2O5 was studied for films thicker than 20 nm. Residual strain was determined using SAED of the films with reference to powder X-ray diffraction (XRD). Films thicker than 45 nm become amorphous a… Show more

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Cited by 9 publications
(10 citation statements)
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“…As a result of the measured NWs, an average value of 67 ± 10 GPa was determined. This value for Young’s modulus is in agreement with the published data concerning Nb 2 O 5 thin films, however, differs significantly from the available data on Nb 2 O 5 NWs …”
Section: Resultssupporting
confidence: 86%
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“…As a result of the measured NWs, an average value of 67 ± 10 GPa was determined. This value for Young’s modulus is in agreement with the published data concerning Nb 2 O 5 thin films, however, differs significantly from the available data on Nb 2 O 5 NWs …”
Section: Resultssupporting
confidence: 86%
“…As a result of the measured NWs, an average value of 67 ± 10 GPa was determined. This value for Young's modulus is in agreement with the published data concerning Nb 2 O 5 thin films, 59 however, differs significantly from the available data on Nb 2 O 5 NWs. 34 For a Nb 2 O 5 /Al 2 O 3 core−shell NW with a shell thickness of 10 nm, as shown in Figure 8, a value of 67 GPa was chosen for Young's modulus of the Nb 2 O 5 core and a value of 160 GPa for the Al 2 O 3 shell.…”
Section: Modeling With E−b and Timoshenko Theoriessupporting
confidence: 87%
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“…In addition, as Cr 3+ is oxidized, some of the strong ligand field stabilization for the octahedral site is removed, creating a large driving force for a collapse of the structure. In addition, the large size difference of Cr 6+ and Cr 3+ in the Cr layers can lead to mechanical stress, resulting in a crystalline-to-amorphous transition when the stress is accumulated, as often observed in metal oxides and silicon. …”
Section: Discussionmentioning
confidence: 99%
“…Table 1 lists the refined parameters for the monoclinic (1.8 GPa) and orthorhombic (9.9 GPa) phases. With further increasing pressure, most diffraction peaks disappear at 21.4 GPa, except the two broad bands at approximately 3.0 Å and 3.4 Å, which are associated with an amorphous phase [44,45]. Subsequently, the two broad bands are further broadened and weakened with increasing pressure, yet still detectable up to a pressure of 28.7 GPa.…”
Section: Methodsmentioning
confidence: 96%