2020
DOI: 10.1109/temc.2019.2948478
|View full text |Cite
|
Sign up to set email alerts
|

Resilience of Error Correction Codes Against Harsh Electromagnetic Disturbances: Fault Elimination for Triplication-Based Error Correction Codes

Abstract: Modern safety-critical systems rely heavily on robust communication channels. Even though these communication channels can be protected by Error Detection and Correction Codes, vulnerabilities caused by False Negatives still exist. These False Negatives can be caused by harsh electromagnetic disruptions and are detriment to overall safety. This paper considers the construction and structure of Triplication-based Error Correction Codes to find the most EMI-resilient code. Each code is tested and simulated in te… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
16
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
5
1

Relationship

3
3

Authors

Journals

citations
Cited by 12 publications
(16 citation statements)
references
References 12 publications
0
16
0
Order By: Relevance
“…Alongside repetitiveness, all-zero or all-one code words should be avoided in order to lower the rate of False Negatives. These conclusions were drawn in [5] and specific code alterations to lower (and possibly eliminate) the occurrences of False Negatives are given in [2].…”
Section: Emi Fault Modelmentioning
confidence: 91%
See 4 more Smart Citations
“…Alongside repetitiveness, all-zero or all-one code words should be avoided in order to lower the rate of False Negatives. These conclusions were drawn in [5] and specific code alterations to lower (and possibly eliminate) the occurrences of False Negatives are given in [2].…”
Section: Emi Fault Modelmentioning
confidence: 91%
“…When speaking in binary terms, injecting a bit-flip is done by performing the XOR operation between the bit value and a logical '1'. The XOR operation then transforms a binary '1' into a '0' and vise versa, as illustrated by (2).…”
Section: B Systematic Fault Injection Modelmentioning
confidence: 99%
See 3 more Smart Citations