2004
DOI: 10.1117/12.546505
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Resistance noise scaling in a dilute two-dimensional hole system in GaAs

Abstract: The 1/f resistance noise of a two-dimensional (2D) hole system in a high mobility GaAs quantum well has been measured on both sides of the 2D metal-insulator transition (MIT) at zero magnetic field (B = 0), and deep in the insulating regime. The two measurement methods used are described: I or V fixed, and measurement of resp. V or I fluctuations. The normalized noise magnitude S R /R 2 increases strongly when the hole density is decreased, and its temperature (T ) dependence goes from a slight increase with T… Show more

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Cited by 3 publications
(2 citation statements)
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References 86 publications
(198 reference statements)
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“…1). The qualitative agreement between our theoretical results and the experimental 2D MIT data is prima facie evidence that our proposed physical mechanism is likely to be playing a role (perhaps even a major role) in the underlying physics of 2D MIT phenomena [7][8][9][10][11][12]15,18,19,[21][22][23][26][27][28][29] . We cannot, however, rule out (certainly, not conclusively) the possibility of alternate physical mechanisms also playing some role in the 2D MIT phenomena since our model is based only on the single physical mechanism described in this work.…”
Section: Introductionsupporting
confidence: 70%
“…1). The qualitative agreement between our theoretical results and the experimental 2D MIT data is prima facie evidence that our proposed physical mechanism is likely to be playing a role (perhaps even a major role) in the underlying physics of 2D MIT phenomena [7][8][9][10][11][12]15,18,19,[21][22][23][26][27][28][29] . We cannot, however, rule out (certainly, not conclusively) the possibility of alternate physical mechanisms also playing some role in the 2D MIT phenomena since our model is based only on the single physical mechanism described in this work.…”
Section: Introductionsupporting
confidence: 70%
“…Resistance noise was also measured in very clean 2D hole systems (2DHS) in GaAs (Leturcq et al, 2003;Deville et al, 2005;Deville et al, 2006). Even though an orders of magnitude enhancement of the noise was observed with decreasing T and hole density p s , similar to the results on 2DES in Si and bulk doped Si, no evidence for strong correlations or glassiness was found.…”
Section: Discussionmentioning
confidence: 52%