2011
DOI: 10.1088/1367-2630/13/1/013020
|View full text |Cite
|
Sign up to set email alerts
|

Resistance switching at the nanometre scale in amorphous carbon

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

6
84
0
1

Year Published

2014
2014
2023
2023

Publication Types

Select...
6
3

Relationship

1
8

Authors

Journals

citations
Cited by 78 publications
(91 citation statements)
references
References 28 publications
(44 reference statements)
6
84
0
1
Order By: Relevance
“…This behaviour is similar to resistive switching that has been seen in carbon devices before [33]. The proposed switching mechanism in these devices is Joule heating within the nanocrystalline microstrucuture of the DLW region, which produces a conductive filament through annealing [34,35]. The physical effect of the annealing is believed to be clustering and alignment of the sp 2 hybridized sites within the sp 3 matrix of the amorphous carbon along the direction of the applied bias.…”
Section: Resultssupporting
confidence: 67%
“…This behaviour is similar to resistive switching that has been seen in carbon devices before [33]. The proposed switching mechanism in these devices is Joule heating within the nanocrystalline microstrucuture of the DLW region, which produces a conductive filament through annealing [34,35]. The physical effect of the annealing is believed to be clustering and alignment of the sp 2 hybridized sites within the sp 3 matrix of the amorphous carbon along the direction of the applied bias.…”
Section: Resultssupporting
confidence: 67%
“…After this process, the filament remains in the a-C layer even when the switch is opened. Detailed investigations of the filament-formation process in a-C at the nanoscale, including the field/temperature dependence, had been performed using a conductive-mode AFM [7]. Once the filament has been formed, there is a marked difference in the conduction behavior: metallic transport is observed, and the total resistance of the switch reduces to 15 kΩ.…”
Section: Contact Materials Static Characteristicsmentioning
confidence: 99%
“…The a-C used as a coating has a low surface energy, similar to other carbon-based materials, and it can be deposited with a simple physical sputter-deposition process suitable for full wafer integration. Moreover, Jouleheating-induced clustering of sp 2 hybridized carbon atoms [7] enables current conduction in a localized filament without creating excessive adhesion force, thus enabling NEM relays to operate with a restoring force well below 100 nN.…”
Section: Introductionmentioning
confidence: 99%
“…The possibility of making memory on the base of amorphous carbon is shown in experiment [1]. Present work is directed to simulation of experimentally observed effects.…”
Section: Introductionmentioning
confidence: 98%