2021
DOI: 10.3390/ijms22073390
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Resistive Switching Characteristic Improvement in a Single-Walled Carbon Nanotube Random Network Embedded Hydrogen Silsesquioxane Thin Films for Flexible Memristors

Abstract: In this study, we evaluated the improved memristive switching characteristics of hydrogen silsesquioxane (HSQ) nanocomposites embedded with a single-walled carbon nanotube (SWCNT) random network. A low-temperature solution process was implemented using a flexible memristor device on a polyethylene naphthalate (PEN) substrate. The difference in the resistive switching (RS) behavior due to the presence of the SWCNT random network was analyzed by the current transport mechanism. Such a random network not only imp… Show more

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Cited by 11 publications
(4 citation statements)
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“…In contrast, for the HRS and LRS of memristors without SWCNT random networks, the R avg values were 1.69 × 10 3 Ω and 2.25 × 10 2 Ω, respectively, with corresponding SDs of 1.08 × 10 2 Ω and 6.34 Ω. Consequently, the RS memory window, which is defined as the minimum HRS (HRS min )/maximum LRS (LRS max ), and the uniform resistance distribution of the nanocomposite memristors with SWCNT random networks were 2.3 times that of devices without SWCNTs. This is because the embedded SWCNT random network affects the interface dynamics of the chitosan thin-film layer via the adsorption of metal ions [ 34 ], which affects its interface dynamics, resulting in a large memory window through stable multilevel RS operation [ 35 ].…”
Section: Resultsmentioning
confidence: 99%
“…In contrast, for the HRS and LRS of memristors without SWCNT random networks, the R avg values were 1.69 × 10 3 Ω and 2.25 × 10 2 Ω, respectively, with corresponding SDs of 1.08 × 10 2 Ω and 6.34 Ω. Consequently, the RS memory window, which is defined as the minimum HRS (HRS min )/maximum LRS (LRS max ), and the uniform resistance distribution of the nanocomposite memristors with SWCNT random networks were 2.3 times that of devices without SWCNTs. This is because the embedded SWCNT random network affects the interface dynamics of the chitosan thin-film layer via the adsorption of metal ions [ 34 ], which affects its interface dynamics, resulting in a large memory window through stable multilevel RS operation [ 35 ].…”
Section: Resultsmentioning
confidence: 99%
“…In memristors with counterclockwise switching, when the applied memristor voltage is larger than the positive threshold voltage V p , the resistance of the memristor decreases. On the contrary, in memristors with clockwise switching, applying a voltage larger than V p causes an increase in resistance, while the resistance decreases when the applied voltage is less than −| V n | (Min and Cho, 2021).With an applied voltage between −| V n | and V p , the resistance remains constant.…”
Section: Memristor Modelmentioning
confidence: 98%
“…Memristor electrodes not only carry electric current, but may also participate in the resistive reaction. They are commonly made from the following materials: conventional metals [ 27–31 ], noble metals [ 32 , 33 ], alloys [ 34–36 ], carbon-based materials such as graphene [ 37 ] and carbon nanotubes [ 38 ], nitrides such as TiN [ 16 ] and TaN [ 39 ], transparent conductive flexible oxides such as indium tin oxide (ITO) [ 29 , 39 , 40 ] and doped ITO [ 41 ], F-doped tin oxide (FTO) [ 42–46 ], etc. The common electrode materials can be classified into four types according to their different role in RS behavior.…”
Section: Materials Of Memristorsmentioning
confidence: 99%