2012
DOI: 10.1063/1.4746277
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Resonant control of an atomic force microscope micro-cantilever for active Q control

Abstract: Active Q control may be used to modify the effective quality (Q) factor of an atomic force microscope (AFM) micro-cantilever when operating in tapping mode. The control system uses velocity feedback to obtain an effective cantilever Q factor to achieve optimal scan speed and image resolution for the imaging environment and sample type. Time delay of the cantilever displacement signal is the most common method of cantilever velocity estimation. Spill-over effects from unmodeled dynamics may degrade the closed l… Show more

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Cited by 29 publications
(31 citation statements)
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“…By representing the piezoelectric shunt control system in block diagram form, as shown in Fig. 3, the transfer function from the applied voltage v s to tip displacement d is determined to be [11] …”
Section: Piezoelectric Shunt Controlmentioning
confidence: 99%
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“…By representing the piezoelectric shunt control system in block diagram form, as shown in Fig. 3, the transfer function from the applied voltage v s to tip displacement d is determined to be [11] …”
Section: Piezoelectric Shunt Controlmentioning
confidence: 99%
“…Tapping mode AFM has a relatively slow scan speed compared with alternative imaging modes. The maximum obtainable scan speed is limited by the bandwidth of the z-axis feedback loop, which is inversely proportional to the quality (Q) factor of the sensing cantilever [8]- [10]. Significant increases in scan speed have been demonstrated with the use of active Q control to reduce the cantilever Q factor [8]- [11].…”
Section: Introductionmentioning
confidence: 99%
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