2016
DOI: 10.1039/c5cp04498g
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Resonant Raman scattering of ZnSxSe1−x solid solutions: the role of S and Se electronic states

Abstract: A comprehensive Raman resonance scattering study of ZnSxSe1-x (ZnSSe) solid solutions over the whole compositional range (0 ≤ x ≤ 1) has been carried out using 325 and 455 nm excitation wavelengths. The Raman scattering intensities of LO ZnS-like and ZnSe-like phonon modes, corresponding to pure S and Se vibrations, respectively, are revealed to be significantly enhanced when excited with 325 nm excitation in the case of S vibrations, and with 455 nm in the case of Se vibrations. This behavior is explained by … Show more

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Cited by 46 publications
(29 citation statements)
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“…This coupling of the 532 nm photons with the 2.4 eV band induces a selective enhancement of the peaks related to vibrations where these atoms are involved, while it should not take place at an excitation with 633 nm (1.9 eV). Similar effects have been reported for different materials such as Cu 2 ZnSnSe 4 40, MoS 2 41 and are explained in detail for the Zn(S, Se) system43.…”
Section: Resultssupporting
confidence: 86%
See 1 more Smart Citation
“…This coupling of the 532 nm photons with the 2.4 eV band induces a selective enhancement of the peaks related to vibrations where these atoms are involved, while it should not take place at an excitation with 633 nm (1.9 eV). Similar effects have been reported for different materials such as Cu 2 ZnSnSe 4 40, MoS 2 41 and are explained in detail for the Zn(S, Se) system43.…”
Section: Resultssupporting
confidence: 86%
“…Similar analyses of how parameters such as composition, degradation, process temperature, layer thickness, etc. affect the Raman spectra and correlate with optoelectronic properties and device performance have been performed extensively in other photovoltaics material systems such as Si49, CIGSSe24, CZTSSe4043. It has to be stressed, however, that a meaningful interpretation of these correlations always requires a careful calibration of the measured Raman parameter with the optoelectronic properties to be evaluated.…”
Section: Resultsmentioning
confidence: 99%
“…At the surface, Cu x Se is clearly detected with all three excitation wavelengths, 22 in agreement with the EDX and XRD analysis. At the back side, ZnSe is observed when using 488 nm excitation 23 together with Sn-Se phases, 24 and a very weak and broad band that is tentatively attributed to amorphous CZTSe. In any case, no evidences of Cu-Sn-Se phases are present, in agreement with the in-depth physical separation of Cu and Sn observed by EDX.…”
Section: Energy and Environmental Science Papermentioning
confidence: 93%
“…Raman scattering is a powerful nondestructive tool very sensitive to both the atomic composition and the crystal quality of the layers, and has already been reported for the quantitative composition analysis of chalcogenide semiconductors, including the assessment of the S/(S + Se) content ratio in sulfo-selenide alloys from the CIGS, CZTS and Zn(S,Se) systems. [9][10][11] Raman scattering analysis of Zn(O,S) solid solutions has already been reported in ref. [12][13][14][15].…”
Section: Introductionmentioning
confidence: 99%