2019
DOI: 10.1038/s41467-019-12750-0
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Revealing ferroelectric switching character using deep recurrent neural networks

Abstract: The ability to manipulate domains underpins function in applications of ferroelectrics. While there have been demonstrations of controlled nanoscale manipulation of domain structures to drive emergent properties, such approaches lack an internal feedback loop required for automatic manipulation. Here, using a deep sequence-to-sequence autoencoder we automate the extraction of latent features of nanoscale ferroelectric switching from piezoresponse force spectroscopy of tensile-strained PbZr0.2Ti0.8O3 with a hie… Show more

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Cited by 40 publications
(55 citation statements)
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“…[29] Subsequently, the authors applied an NN-based autoencoder to the piezoresponse and contact resonance of the same dataset, and proposed a different interpretation based on contributions from charged domain walls in head-to-head polarization configurations. [31] We show that through careful model parameter selection, appropriate application of the physical understanding and constraints, and based on the knowledge of the system under investigation, we can gain better insights into the fundamental ferroelectric behavior in the datasets described above. Specifically, through the application of clustering methods, we identify and remove from consideration localized outliers and instrumentation contributions.…”
Section: Ti 08 O 3 Thin Films Through Systematic Analysis and Intromentioning
confidence: 96%
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“…[29] Subsequently, the authors applied an NN-based autoencoder to the piezoresponse and contact resonance of the same dataset, and proposed a different interpretation based on contributions from charged domain walls in head-to-head polarization configurations. [31] We show that through careful model parameter selection, appropriate application of the physical understanding and constraints, and based on the knowledge of the system under investigation, we can gain better insights into the fundamental ferroelectric behavior in the datasets described above. Specifically, through the application of clustering methods, we identify and remove from consideration localized outliers and instrumentation contributions.…”
Section: Ti 08 O 3 Thin Films Through Systematic Analysis and Intromentioning
confidence: 96%
“…Here, we apply easily implementable and computationally inexpensive clustering and DR analysis methods augmented with dimensional stacking to previously reported [29,31] ferroelectric switching data collected via band-excitation piezoresponse force microscopy (BE-PFM) [40] on PbZr 0.2 Ti 0.8 O 3 thin films. Agar et al have previously identified the presence and interplay of both ferroelectric and ferroelastic switching in the piezoresponse through clustering and DR analysis, based solely on the piezoresponse, PR.…”
Section: Ti 08 O 3 Thin Films Through Systematic Analysis and Intromentioning
confidence: 99%
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