2020
DOI: 10.1016/j.mattod.2019.11.010
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Revealing nano-chemistry at lattice defects in thermoelectric materials using atom probe tomography

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Cited by 83 publications
(74 citation statements)
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“…We thus employed atom probe tomography (APT) to reveal the distribution and concentration of constituent elements at the atomic scale. [ 70–72 ] Figure 2 a shows a homogeneous distribution of Ge, Sb, and Te in 3D space. The composition profile along the z ‐axis further proves the homogeneity of composition and an average bulk composition close to the nominal Ge 0.9 Sb 0.1 Te (Figure 2b).…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…We thus employed atom probe tomography (APT) to reveal the distribution and concentration of constituent elements at the atomic scale. [ 70–72 ] Figure 2 a shows a homogeneous distribution of Ge, Sb, and Te in 3D space. The composition profile along the z ‐axis further proves the homogeneity of composition and an average bulk composition close to the nominal Ge 0.9 Sb 0.1 Te (Figure 2b).…”
Section: Resultsmentioning
confidence: 99%
“…Since the grain size (≈10 µm) is much larger than the field of view of APT probed volume (50 nm in diameter and 300 nm in length), we could not include the grain boundary in the APT characterization with several measurements. Given the extremely high elemental sensitivity of APT (normally tens ppm level for semiconductors), [ 70 ] we can conclude that boron is not dissolved into the grain interior but primarily impacts the grain boundary properties.…”
Section: Resultsmentioning
confidence: 99%
“…To spatially determine the distribution and composition of surface SnO x , we conducted APT analysis on the untreated SnSe sample. It quantitatively provides the three-dimensional distribution of constituent elements with equal sensitivity at a spatial resolution nearly down to the subatomic level, thereby serving as an effective tool to resolve secondary phases either in the matrix or trapped at GBs [18][19][20] . Figure 3f displays the three-dimensional reconstruction of the needle-shaped specimen from the untreated SnSe sample.…”
Section: Analysis Of Surface Snomentioning
confidence: 99%
“…Good TE materials could particularly be the case since they always need to be alloyed or doped to tune the electrical and thermal properties for high performance, which unavoidably leads to complicated microstructures [ 8 , 182 , 183 ]. Hence, a deep microstructure analysis to know the grain boundary region better with advanced techniques is highly necessary [ 184 , 185 ]. For n -type Mg 3 Sb 2 polycrystalline samples, the grain boundary phase is found to be a 10 nm region with Mg deficiency [ 98 ], resulting in the high electrical resistance.…”
Section: Optimization Of Te Propertiesmentioning
confidence: 99%