“…Most of them use statistical surface parameters largely dependent on resolution (Tien, 1968;Cooper et al, 1969;Mikic, 1974;Yovanovich, 1987), and therefore should be used with great care when the original assumptions are not satisfied (particularly in the use of microscopic constitutive laws which depend strongly on the determination of asperity contacts size). For a quite extensive review (although dedicated to thermal contact conductance instead of electrical conductance), see Lambert and Fletcher (1997), and the references therein. One original model using fractal geometry for the surface characterization, was introduced also for electrical contact (Majumdar and Tien, 1991), but using a network of resistances in series and parallel, where the assumed patterns are based on properties of the surface profiles independently of the contact process.…”