2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology 2010
DOI: 10.1109/icsict.2010.5667479
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RF characteristics of a high voltage LDMOSFET

Abstract: Stack-transistor structure is often used in RF applications for higher power handling capability and/or isolation. LDMOSFET may provide similar advantages with smaller device area and lower series resistance. The purpose of this work is extracting the RF parameters of a LDMOSFET and design a RF switching circuit with these parameters. The design trade-off between LDMOS and CMOS technologies was discussed in this paper. The simulated results of this LDMOS RF switch exhibit excellent agreement to the measured da… Show more

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“…However, the drain-source blocking voltage is in the range of 100 volts, and the current driving capability of this device is usually high. The advantages of LDMOSFET [1][2][3] are that it requires only a small input current and high switching speed can be controlled with a very small gate current. Hence, LDMOSFET has found an increasing application in gate driver IC and high power converters [4,5].…”
Section: Introductionmentioning
confidence: 99%
“…However, the drain-source blocking voltage is in the range of 100 volts, and the current driving capability of this device is usually high. The advantages of LDMOSFET [1][2][3] are that it requires only a small input current and high switching speed can be controlled with a very small gate current. Hence, LDMOSFET has found an increasing application in gate driver IC and high power converters [4,5].…”
Section: Introductionmentioning
confidence: 99%
“…The most important procedure for extracting model parameters arises from the determination of the extrinsic elements, as it strongly affects the extraction result of the whole small-signal model. Earlier works often didn't take the substrate effect into account [2] , and obtained the extrinsic resistances by simplified equations Re( ) , Re( ) ,and Re( ) at zero-bias, which is limited to low frequencies, as it omits the influence of the lossy Si substrate region beneath the drain-bulk junction. The method in [3], [4], and [5] extracting parasitic resistances in strong inversion( , 0) neglects the dependence of drain resistance on drain-source voltage, which does not apply to LDMOSFET.…”
Section: Introductionmentioning
confidence: 99%