In this paper, RF performance and non-linearity analysis of different silicon substrates including standard, porous, high-resistivity (HR) and trap-rich HR types (TR) are explored experimentally and by simulation. The investigation is done by means of coplanar transmission lines (CPW) fabricated on these substrates. It is demonstrated that TR-Si characteristics in terms of high resistivity, attenuation and linearity are effectively enhanced.Index Terms -High-resistivity (HR) Si substrate, non-linear analysis, trap-rich (TR) Si substrate, porous silicon (PSi), CMOS technology, harmonic distortion.