“…The inductance linearly increases from 0.13 to 0.33 nH for 40-to 320--long lines, with an inductance per meter of for the line. This value is fully consistent with standard values for CPWs found in literature for similar dimensions [5], [7], [16]. The extracted inductance of one via is at frequencies below 100 MHz.…”
Section: Inductancesupporting
confidence: 91%
“…The main contribution to the total inductance depends on the length of the line. This inductance value is proportionally two times lower than inductance obtained for moderate aspect ratio vias described in [6] and [7], and 500-1000 times lower than wire bonding, making TSV very attractive for 3D integration. The resonance peaks fall at the resonance peaks already described in the resistance curves.…”
Section: Inductancementioning
confidence: 66%
“…Obviously, a basic model with RLC series is not sufficient to match the measured resonance frequencies, the capacitance and inductance levels independently, as has already been observed by others [19], [20]. In contrast a numerical simulation is very often to opaque and does not give a simple explanation for a certain behavior [7], [8]. Here, we propose an advanced analytical model for the lines+vias system, which is presented in Fig.…”
Section: F Modellingmentioning
confidence: 93%
“…In addition, the RF data are not always linked to the dc behavior and other via properties. The RF characterization is either done on one-port reflective RF structures ( [5], [6]), or on low aspect ratio ( 5) vias ( [7], [8]). In terms of modelling, the existing papers on TSV simulations are using complicated numerical techniques like finite element methods, with no clear links to the processing and the real measurements [7], [8].…”
Section: Rf Characterization and Analytical Modelling Of Through Silimentioning
“…The inductance linearly increases from 0.13 to 0.33 nH for 40-to 320--long lines, with an inductance per meter of for the line. This value is fully consistent with standard values for CPWs found in literature for similar dimensions [5], [7], [16]. The extracted inductance of one via is at frequencies below 100 MHz.…”
Section: Inductancesupporting
confidence: 91%
“…The main contribution to the total inductance depends on the length of the line. This inductance value is proportionally two times lower than inductance obtained for moderate aspect ratio vias described in [6] and [7], and 500-1000 times lower than wire bonding, making TSV very attractive for 3D integration. The resonance peaks fall at the resonance peaks already described in the resistance curves.…”
Section: Inductancementioning
confidence: 66%
“…Obviously, a basic model with RLC series is not sufficient to match the measured resonance frequencies, the capacitance and inductance levels independently, as has already been observed by others [19], [20]. In contrast a numerical simulation is very often to opaque and does not give a simple explanation for a certain behavior [7], [8]. Here, we propose an advanced analytical model for the lines+vias system, which is presented in Fig.…”
Section: F Modellingmentioning
confidence: 93%
“…In addition, the RF data are not always linked to the dc behavior and other via properties. The RF characterization is either done on one-port reflective RF structures ( [5], [6]), or on low aspect ratio ( 5) vias ( [7], [8]). In terms of modelling, the existing papers on TSV simulations are using complicated numerical techniques like finite element methods, with no clear links to the processing and the real measurements [7], [8].…”
Section: Rf Characterization and Analytical Modelling Of Through Silimentioning
“…Vias are interconnects commonly found on multilayer printed or integrated circuits [13][14]. Often, they provide some path to ground or to other device via some RDL (Re-Distribution Layer).…”
Abstract:The authors state briefly the possibility of various simulators to handle propagation of electromagnetic waves along some interconnections, in 3D RF (Radio Frequency) circuits. The studies are first derived in the time domain: a Finite-Difference Time-Domain method is applied, taking spectra via FFTs (Fast Fourier Transform) as post-processors. Electric and magnetic field distributions, pulse propagations along stripline structures or vias are highlighted. The scattering parameters for various cases are extracted and compared. Some original issue of this work is an insight on crosstalk or shielding phenomena between lines.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.