Proceedings of the IEEE 1999 Custom Integrated Circuits Conference (Cat. No.99CH36327)
DOI: 10.1109/cicc.1999.777308
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RF simulations and physics of the channel noise parameters within MOS transistors

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Cited by 12 publications
(11 citation statements)
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“…However, for short channel devices the parameter r has been observed to be greater than 2/3 (see [9,15]); when a device length of lOllm was simulated using the noise simulator a y value of 0.7 was obtained. The question is 'where is this excess noise coming from in a short channel device?'…”
Section: Lddnmos Leff=o45 J1mmentioning
confidence: 97%
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“…However, for short channel devices the parameter r has been observed to be greater than 2/3 (see [9,15]); when a device length of lOllm was simulated using the noise simulator a y value of 0.7 was obtained. The question is 'where is this excess noise coming from in a short channel device?'…”
Section: Lddnmos Leff=o45 J1mmentioning
confidence: 97%
“…Frequency (GHz) Figure 4: The contribution of the gate noise at the output compared to drain channel noise [15]. 253 An important quantity is the relative magnitudes of Ii to IJ.…”
Section: Lddnmos Leff=o45 J1mmentioning
confidence: 99%
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